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High Resolution Bruker Diffractometer at the College of Nanoscale Science and Engineering at University of Albany - SUNY

A Bruker AXS customer, the College of Nanoscale Science and Engineering at University of Albany - SUNY, appeared with their Bruker AXS instrumentation on Fox's NanoNow TV with Professor Richard Matyi, CNSE.

In this video Professor Matyi explains how such devices are used in both manufacturing and fundamental research.

Professor Matyi's research centers on the fabrication of nanostructures from various materials (primarily elemental and compound semiconductors) and their characterization with X-ray probes, particularly high resolution X-ray diffractometry and reflectometry.

While this work occasionally has impact in unexpected areas (for instance, the analysis of damage and grown-in defects in protein crystals), it is directed primarily at the development of advanced X-ray analytical methods for problems that are of importance to the semiconductor industry. These include the study of materials ranging from highly perfect semiconductors single crystals to gate dialectics, metallizations and diffusion barriers.

Running Time 01.41

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