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Featured Nanotechnology Videos
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The CSM TTX Table Top Nanoindentation Tester - Operation and Applications |
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The TTX Table Top Nanoindentation Tester from CSM Instruments is a compamct desktop nanoindenation tester. It is a simplified device suited to quality control in industrial applications and retails for under $100k.
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Microanalysis Demonstration of X-Max Silicon Drift Detector SDD by Oxford Instruments |
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An instructional video illustrating the amazing results now achieveable with the X-Max SDD detector. The latest Oxford Instruments' energy dispersive x-ray spectrometer.
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The DPN5000 Dip Pen Nanolithography System from Nanoink - Features and Applications |
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The DPN5000 is aimed at researchers and developers. It can use up to 55,000 tips to write over an area of 1 square centimeter. It also includes full AFM capabilities and incorporates a completely new scanner design compared to previous models and comes in an environmental chamber.
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Ambios Technology Q-View SPM/Interferometer - Capabilities |
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Rick Olds from Ambios Technology shows us through the Q-View. The Q-View which combines scanning probe microscopy (SPM) and interferometer which are interchangeable for taking surface roughness and topography measurements on small and larger areas.
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DT1200 Axoustic Spectrometer from Horiba - Features and Applications |
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The DT-1200 Acoustic & ElectroAcoustic Spectrometer characterizes both particle size and zeta potential of concentrated suspensions. The measuring chamber of the DT-1200 contains both acoustic and electroacoustic sensors.
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The Veeco Dektak 150 Surface Profilometer - Key Features |
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The Dektak 150 Surface Profilometer from Veeco uses stylus profilometry technology, which is the accepted standard for surface topography measurements.
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Future Applications for Dip Pen Nanolithography (DPN) |
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This article looks at the future applications for DPN, Dip Pen Nanolithography
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eXplorer Personal Scanning Electron Microscope (PSEM) from Aspex Corp - Features and Applications |
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Aspex Corp's Tim Drake takes a few minutes to point out the the key features of their Personal Scanning Electron Microscope, PSEM eXplorer, which is an integrated SEM/EDX system designed for rapid automated particle analysis. Some of the main features include large sample chamber and silicon drift detector.
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Micro X-Ray Fluorescence (XRF) Product Range from Bruker AXS |
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Michael Haschke from Bruker
AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments.
He shows us 3 instruments that vary in chamber size, with the largest able to
take samples 30cm in diameter and offering vacuum analysis and a motorized stage
for line scans and area analysis.
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Electron Microscope So Easy to Use a Child Could Do It |
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The Phenom from FEI is a high resolution desktop
imaging tool with an optical camera for never-lost navigation and a
high quality electron microscope for detailed imaging. Its innovative
user interface and intuitive touch screen control produce superb
quality images with minimal operator training. The video presentation
perfectly illustrates the ease of use with young school children being
given the chance to operate the microscope themselves and investigate
the world of the supersmall.
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Key Features and Capabilities of the XE-Bio AFM from Park Systems |
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The key features and capabilities of the XE-Bio AFM (atomic force microscope) are described. These include the unique scanning ion conductance microscopy (SICM) technology that allows imaging of living cells in liquid media.
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The Revetest Xpress Scratch Tester from CSM Instruments - Operation and Features |
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The REVETEST Xpress is definitely the cost effective solution dedicated to Industrial and Quality Control (QC) applications.This Xpress instrument provides measurement of adhesion, hardness and scratch resistance with a very user-friendly, intelligible interface.
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Introduction and Demonstration of the XE-70 Research AFM from Park Systems |
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Joe McGuire, Director of National Sales for Park Systems introduces us to the XE-70 Research AFM. He outlines the key features and attributes of this atomic force microscope, including hardware and software
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Asylum Research's Family of Atomic Force Microscopes (AFM) |
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A video clip from Asylum Research on their family of AFMs (atomic force microscopes). This briefly outlines their range of instruments and includes their latest addition the Cypher, which provides the most advanced AFM produced in the last decade.
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Guided Tour of Dip Pen Nanolithography (DPN) |
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This video from Nanoink is a guided tour of how dip pen nanolithography works
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The Smart SPM/AFM from AIST-NT - Ease of Use Demonstration |
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Marshall Bates and Andrey Krayev from AIST-NT demonstrate the ease of use of the AIST SmartSPM/AFM. From loading a sample to starting to take measurements can be completed in 1-2 minutes, at atomic resolutions
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The DPN5000 from Nanoink - A Pre-Launch Look |
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In this pre-launch interview, Tom Levesque from Nanoink tells us about the DPN5000 which is the next generation Dip Pen Nanolithiography (DPN) system. This ineterview was recorded at the MRS Fall Meeting in 2008 in Boston ahead of the official launch of the DPN5000 system at Pittcon in Match 2009.
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Pulmonary Nanoparticle Delivery |
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A pulmonary delivery device, based on surface acoustic wave technology, is being developed for the delivery of drugs such as insulin, in the form of a liquid aerosol.
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Active Pens from NanoInk for Dip Pen Nanolithography |
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This is a demonstration of Active Pens, where NanoInk controls
each individual pen’s contact with the substrate enabling us
to write with different inks on each pen and to not contaminate the
areas adjacent to the one which is being written.
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VESTA Localized Thermal Analysis System from Anasys Instruments - Video Demonstration |
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Kevin Kjoller, Vice President of Product Development at Anasys Instruments demonstrates how easy the VESTA localized thermal analysis system is to use.
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Neos AFM from Bruker AXS - Features and Applications |
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The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up. The combination of the NANOS AFM / SPM and a high power optical microscope on a highly rigid granite stand makes the N8 NEOS a highly effective and exceptionally versatile inspection system.
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Key Features of easyScan2 FlexAFM from Nanosurf |
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Ola Modinger from Nanosurf points out some of the key features of their easyScan2 FlexAFM that was released at the 2008 MRS Fall Meeting, where this interview was recorded.
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Formation of Lipid Bilayer - A Video by Farfield Group |
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This video shows the deposition of liposomes on to the surface of an optical chip and their subsequent rupture and merger to form a lipid bilayer. Protein molecules then embed and float in the surface of the bilayer. This is an excerpt from a video that iemedia solutions produced for the Scientific Instrumentation Division of the Farfield Group to illustrate the measurement capabilities of their Dual Polarisation Interferometry technology.
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The NLP2000 Dip Pen Nanolithography System from Nanoink - Features |
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Tom Levesque from Nanoink takes us for a tour of the latest dip pen nanolithography system from Nanoink. The NLP2000 was launched at Pittcon 2009.
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PANalytical AXIOS X-Ray Fluorescence (XRF) Spectrometer - Features and Applications |
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David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.
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Nanosurf easyScan2 FlexAFM - Introduction and Demonstration |
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Ola Modinger from Nanosurf gives us and introduction to the their easyScan2 FlexAFM that was released at the 2008 MRS Fall Meeting, where this interview was recorded. We then get a demonstration of how easy this instrument is to operate.
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Dip Pen Nanolithography |
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Here is a “Nanimation” of the Dip Pen Nanolithography Process in Action
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New Zetasizer Product Range from Malvern Instruments |
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The Zetasizer range uses light scattering techniques to measure hydrodynamic size, zeta potential and molecular weight of proteins and nanoparticles.
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Designing, Writing and Inspecting Nano Sized Electronics with a Dip Pen Nanolithography (DPN) System |
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This article looks at using the NSCRIPTOR from Nanoink to design, write and inspect nanoelectronic circuits
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Malvern Instruments Zetasizer Nano Particle Characterization System |
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Ulf Nobbmann from Malvern Instruments shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.
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Malvern Instruments Morphologi G3 Particle Characterization System - Features and Demonstration |
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Janie Dubois from Malvern Instruments takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.
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NTEGRA Aura SPM Platform from NT-MDT |
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This flexible SPM platform can be modified in numerous ways to adapt to various sample types as well as to take different types of measurements.
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The Light Engine from Lumencor |
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Lumencor was formed to design lighting technology for life science applications. Claudia Jaffe from Lumencor introduces us to their Light Engine which is an all-in-one device that combines: power; durability; discreetness, spectral cleanliness; long life; cool operating temperature; small footprint and; cost effectiveness.
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The Phenom - World's Fastest Desktop Electron Microscope |
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Introducing the new Phenom benchtop electron microscope from FEI. With today's industry requiring higher quality control and speed, the Phenom can produce high resolution images from submicron to nanoscale in seconds. It as easy as using a digital camera.
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How Dip Pen Nanolithography (DPN) Works |
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How Dip Pen Nanolithography works
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Agilent G200 Nano Indenter - Features and Capabilities |
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Nano Indenter G200 is the most advanced platform for exploring material properties at the nano and micro scales. Its state of the art motion system speeds sample throughput without sacrificing accuracy. It also conforms to ISO 14577 - 1, 2 & 3; delivering confidence in test accuracy and repeatability.
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NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM) from JEOL |
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Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.
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The First Ever Global Study on The AFM Market Conducted with AFM Users |
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In this exclusive interview with Barbara Foster from the Microscopy and Imaging Place or The MIP conducted at Pttcon 2009, we learn about a new market report. It is in fact the first ever global report on the AFM market place using feedback from AFM users themselves.
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The NLP2000 Dip Pen Nanolithography from Nanoink - A Pre-Launch Look |
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In this pre-launch interview, Tom Levesque from Nanoink tells us about the NLP2000 which is the next generation Dip Pen Nanolithiography (DPN) system. This system is easy to use and can cater for large substrates as it does not have an integrated AFM. The absence of an AFM reduces the cost of the device and increases its versatility.
Click here for more information
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eXpress Personal Scanning Electron Microscope from Aspex Corp |
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Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.
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Perfusate pH Changes from Acidic to Alkaline Triggering Conformational Change in BSA - A Video by Farfield Group |
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This video shows Bovine Serum Albumin (BSA) molecules binding to BS3 molecules adhering to the surface of an optical chip. The BSA molecules then undergo a conformational change as the pH of the perfusate changes from acid to alkaline. This is an excerpt from a video that iemedia solutions produced for the Scientific Instrumentation Division of the Farfield Group to illustrate the measurement capabilities of their Dual Polarisation Interferometry technology.
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Parts of a Nanoink Dip Pen Nanolithography (DPN) System |
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This video takes a brief look at the component hardware parts of the Nanoink DPN
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Transdermal Delivery |
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A MicroArray Patch technology is being developed for the transdermal delivery of large molecule drugs, without the use of injections.
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Key Features and Capabilities of the Agilent Technologies 7020 Zetaprobe |
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The Agilent Technologies 7020 Zetaprobe measures zeta potential of suspensions. It can cater for samples with high solids loadings, which can eliminate the need for diluting samples.
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The Accusizer 780 Laser Diffraction Particle Size Analyzer from Agilent Technologies |
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The Agilent Technologies AccuSizer 780 is a laser diffraction particle size analyzer that measures the size of individual particle to produce high accuracy particle size distributions
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Agilent 5600 Large Stage AFM - Key Features and Capabilities |
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The Agilent 5600LS utilizes a fully addressable 200 mm x 200 mm stage and a new, low-noise AFM design. The programmable, motorized stage enables fast, accurate probe positioning for imaging and mapping large specimens at atomic-scale resolution using a state-of-the-art Agilent AFM.
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The Nicomp 380 ZLS Particle Size and Zeta Potential Analyzer from Agilent Technologies |
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The Agilent Nicomp 380 ZLS can measuire both particle size and zeta potential. Particle size is determined by dynamic light scattering or DLS and trhe Nicomp 380 ZLS can measure particles from a few nanometers to microns.
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LM20 Nanoparticle Analysis System from Nanosight |
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Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system
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Molecular Binding - Farfield Group Video Illustrating Measurement Capabilities of DPI Technology |
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This video shows the binding of Immunoglobulin G (IgG) protein molecules to BS3 adhering to the surface of an optical chip and the subsequent binding of another protein to the antigen binding sites on the arms of each IgG molecule. This is an excerpt from a video that iemedia solutions produced for the Scientific Instrumentation Division of the Farfield Group to illustrate the measurement capabilities of their Dual Polarisation Interferometry technology.
Click here for more information
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Capabilities and Key Features of the Park Systems XE-NSOM AFM |
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The key features and capabilities of the Park Systems XE-NSOM, atomic force microscope incorporating near-field scanning optical microscopy are demonstrated and a details explanation of its operation is provided.
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SOLVER NEXT SPM from NT-MDT - Operation and Key Features |
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The Solver Next from NT-MDT is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time.
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The Asylum Cypher High Resolution AFM - Key Features |
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You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher(TM) AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with striking ease of use.
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Diagnostic Imaging |
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Nanoparticles are being developed for diagnostic imaging, for the early detection of neurological disease, cardiovascular disease and cancer. The technology is based upon contrast nanoparticles which can be metallic, magnetic or polymeric in nature. These particles can be functionalised with a biological targeting agent such as an antibody and are generally between 10 and 100 nm in diameter.
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Researchers Using Nanoink's DPN Technology to Create New Materials |
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Researchers at Texas A&M University talk about how they are using Nanoink's Dip Pen Nanolithography (DPN) technology to create new materials and its vast potential to achieve what was previously impossible. They outline a new technology whereby DPN can be used to detect explosives.
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alpha300 Raman/AFM/SNOM from WITec - Features and Applications |
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The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.
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The Dimension V AFM/Nanomechanical Tester from Veeco - Key Features and Operation |
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The Dimension V from Veeco combines an atomic force microscope (AFM) with a nanomechanical tester. This is achieved using a specifically designed probe. It is able to measure properties such as stiffness, adhesion and energy dissipation as well as provide the imaging capabilities of an AFM.
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Key Features and Capabilities of the Agilent Technologies Scanning Microwave Microscopy System |
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Agilent Technologies' unique scanning microwave microscopy (SMM) mode combines the comprehensive electrical measurement capabilities of a performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope (AFM).
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CSM Nanoindentation Testing Platform - Versatile Testing System |
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The Nanoindenation platform is a versatile system available in two configuations that allows you to build a device tailored to your specific requirements. You can incorporate various testing modules such as nano and microindentation, nano and microscratch or micro/nanoscratch module, with your choice of imaging systems choosing form video microscope, AFM or profilometer.
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