A Schottky FE-Scanning Electron Microscope: The SU7000

The SU7000 from Hitachi is the ultimate all-rounder when it comes to high performance since it is equipped with an ultra high resolution Schottky FESEM that provides powerful analysis and nanoscale imaging.

(1) Upper detector (UD): microstructure, potential contrasts; (2) Middle detector (MD): high resolution material contrast; (3) Lower (chamber) detector (LD): topography.

(1) Upper detector (UD): microstructure, potential contrasts; (2) Middle detector (MD): high resolution material contrast; (3) Lower (chamber) detector (LD): topography. Image Credit: Hitachi High-Tech Europe

Advanced Imaging and Analysis Combined

  • Users can image and analyze any type of sample easily using the field-free optics and variable pressure operation
  • Sub-nanometer resolution is provided even below 1 kV
  • [email protected]: six signals, as well as EDS, can be observed at the same time at 6 mm working distance

Flexible Handling of Samples

  • Quick sample exchange via either the front door, load lock, or exchange chamber
  • Substages can be added in-situ for dynamic experiments
  • Users can easily and safely navigate their sample with the help of the combined color NaviCam

Clean and Flexible Vacuum System

  • Change to variable pressure at any time with just a single click
  • Users can keep both system and samples as clean as possible by adding a UV or plasma cleaner or by using the dry vacuum system
  • No limitation in the field of view or probe current when shifting to variable pressure

Future Proof

  • Built for quick and detailed analysis with single or several WDS, EBSD, and EDS detectors
  • Add CL for more information from pharmaceuticals, photonics, or minerals
  • 21 accessory ports provide excellent expandability
  • Image sensitive or hydrated samples with the help of Hitachi’s patented Ionic Liquid or cryo stage 

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