Electron Backscatter Diffraction (EBSD) EDAX APEX™ Software

EDAX APEX EBSD is a user-friendly software platform that enables the characterization of electron cackscatter diffraction (EBSD) patterns.

Users can simply, quickly, and reliably collect high-quality data using strong pattern analysis and an accessible UI. APEX improves user productivity and provides the best option for microstructural characterization when combined with EDAX hardware.

Electron Backscatter Diffraction (EBSD) APEX™ Software Platform

Image Credit: Gatan

Ease of use

  • Intuitive operation for beginners and skilled users
  • Automatic optimization of EBSD detector and data collection parameters
  • Application tabs for analysis modes are set up, and each tab contains logical sets of suitable functions
  • Graphical ribbon bar permits rapid access to functions and features

APEX EBSD ribbon bar.

APEX EBSD ribbon bar. Image Credit: Gatan

Adjustable layouts

  • The ability to rearrange and resize data view windows as desired by the user
  • Each application tab has a variety of layouts that display the appropriate view windows for the selected action
  • Users can choose from a variety of color schemes to suit their tastes or the scanning electron microscope (SEM) interface
  • Users can store and utilize customized layouts

Context sensitive layout selection.

Context-sensitive layout selection. Image Credit: Gatan

User customization

  • Windows® Authentication for login if required
  • Single- or multi-user modes
  • Individual settings saved for each user


Triplet Indexing engine

  • Sensitivity to rogue band detection is decreased by the novel three-bands (triplets) indexing technique
  • With Triplet Indexing, users can obtain excellent indexing success rates even at the fastest EDAX Velocity EBSD detector speeds
  • The patented Confidence Index value provides a quantifiable evaluation of the quality of the crystallographic indexing solution
  • Improve band detection options on the dedicated Hough page to guarantee that all crystal structures are effectively indexed
  • Generate high-quality indexing results using real-world samples

Triplet Indexing resolves overlapping patterns for better indexing.

Triplet Indexing resolves overlapping patterns for better indexing. Image Credit: Gatan

Comprehensive EBSD data collection

  • Automatic detector optimization for application-specific EBSD data collection
  • Automatic step size recommendations for efficient scanning
  • Multiple scan modes
  • Quickly gather each EBSD pattern or a comprehensive scan
  • Line scan acquisition
  • Hexagonal grid sampling for enhanced data sampling

Dynamic scanning

  • Data statistics summary
  • Hough band detection
  • Crystal unit cell display
  • Feedback gives users information on collection quality
  • During each scan, users can track and assess data collected in real-time with numerical and visual feedback
  • Combine grayscale and color maps to comprehend the results better
  • Grayscale maps incorporate image quality, SEM signal, and PRIAS™ (optional)
  • Color maps include IPF, Confidence Index, phase, and EDS elements
  • EBSD pattern and indexing display

Multiple scanning modes available.

Multiple scanning modes available. Image Credit: Gatan

Montage large area mapping

  • Scans wide areas with stage motions to collect data from multiple domains of study
  • Data is automatically stitched into a single file for thorough examination
  • Oversampling is possible to improve field matching

EBSD mapping example from a high entropy alloy weld.

EBSD mapping example from a high entropy alloy weld. Image Credit: Gatan

Batch scanning

  • Compiles a sequence of scans into a single batch operation
  • Defines standard free-form, Montage, and line scans for a batch
  • Defines the batch’s simultaneous EDS, magnification, step size, scan area, and stage position
  • Enables the effective use of SEM for studying a variety of samples or locations

Data management

  • Default names within the project tree for rapid collection with the option to rename if needed
  • Can specify file name and location to match user requirements
  • HDF file well-matched with APEX Review for EDS analysis and EDAX OIM Analysis for EBSD examination
  • Project tree structure for the seamless organization of data
  • HDF file format for data portability and management
  • 64-bit software architecture for managing big data
  • Single file for both EBSD and EDS collection

Project tree data organization.

Project tree data organization. Image Credit: Gatan

Integrated EDS-EBSD

  • Complete integration of energy dispersive x-ray spectroscopy (EDS/EDX) and EBSD for thorough material characterization
  • Make use of the cutting-edge EDS quant engine, which has been optimized for high-tilt EBSD geometries
  • Correlation of structural and chemical information using an integrated EDS spectrum and EBSD pattern collection
  • Compatible with ChI-Scan™ processing for simultaneous EDS-EBSD scanning for increased multi-phase analysis

Advanced reporting

  • Report production that is customizable based on OIM Analysis user templates
  • Template files with default design templates contain user-defined report content
  • Personalized report layout with Report Designer tool
  • Use reporting with batch scanning capability
  • Users can generate reports using the APEX EBSD or OIM Analysis software

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