The EDAX Trident System seamlessly combines energy dispersive x-ray spectroscopy (EDS), wavelength dispersive spectrometry (WDS), and electron backscatter diffraction (EBSD) analytical techniques on a single platform, delivering a comprehensive materials characterization solution.
Seamless integration is guaranteed through comprehensive data collection and sharing across various techniques. Users have the flexibility to employ each method individually or merge their data, enabling the generation of unprecedented results.
The EDS analysis offers all the necessary tools, from simple qualitative analysis to sophisticated quantitative calculations. The system's standard smart features ensure reliable analysis, data collection, and reporting. EXpert ID also utilizes analytical intelligence to separate overlaps and identify minor peaks.
The EBSD analysis merges the user-friendly software platform with the analytical capabilities of orientation imaging microscopy (OIM), delivering advanced crystal structure characterization to all users.
Notable features like the Confidence Index (CI) and the patented ChI-Scan™ offer a verified assessment of indexing accuracy and facilitate superior multiphase analysis to enhance indexing accuracy and phase identification.
WDS scans complement EDS spectrum collection to provide precise quantitative and qualitative analysis.
The Trident system offers the following key features:
- Integration with Octane Elite silicon drift detectors (SDDs), the platinum standard for EDS analysis.
- Advanced electronics deliver exceptional efficiency and resolution across a wide range of count rates.
- For EBSD, the available choices are the Clarity™ and Velocity™ EBSD cameras. The Clarity delivers EBSD patterns with high fidelity, devoid of noise and distortion, resulting in unparalleled pattern quality and sensitivity. In contrast, the Velocity, driven by a CMOS sensor, excels in high-speed EBSD mapping, offering the highest indexing performance on real-world materials.
- The Lambda Plus and Lambda Super spectrometers are available for WDS analysis.
- It offers swift and straightforward access to both elemental and crystallographic results.
- Allows users to focus their efforts on understanding their materials, rather than on collecting data.