In this video Dr. Jana Bergholtz, Application Scientist EDS, Bruker Nano talks about the new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes. With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM. As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers innovative high-performance technology.
Run Time – 6:19min
SKYSCAN In Vivo X-Ray Microtomograph from Bruker
X-Ray Powder Diffraction with Bruker’s D2 PHASER
Bruker's PeakForce Tapping QNM for Mapping Nanomechanical Properties
Analyzing Living Rocks Using Bruker’s SKYSCAN 2211 Micro-CT System
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