Bruker’s Range of Analytical Tools for SEM

In this video Dr. Jana Bergholtz, Application Scientist EDS, Bruker Nano talks about the new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes. With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM. As a pioneer in instrumentation for X-ray micro- and nano-analysis, Bruker delivers innovative high-performance technology.

Run Time – 6:19min