Feb 23 2009
The National Microelectronics Institute (NMI), the trade association representing the semiconductor industry in the UK and Ireland, in collaboration with the UK's nanoCMOS Consortium, has announced it is to host its second international conference on CMOS variability. ICCV 2009 "Living with Variability" will take place 12-13th May 2009 at the IET's Savoy Place, London.
Aimed at chip designers, technology developers, wafer foundries and EDA tool vendors, the conference will explore the real impact of CMOS variability and how it can be managed at 45nm and below. Sessions presented by world leading experts will introduce the issues, discuss the options and share techniques for meeting the challenges of CMOS variability head-on.
Recognised experts confirmed to speak at what is Europe's only dedicated conference on CMOS variability include:
- Dr Kelin Kuhn, Intel Fellow, Technology and Manufacturing Group
- Dr Sani Nassif, IBM Austin Research Laboratory
- Jean-Marie Brunet, Mentor Graphics
- Krisztián Flautner, ARM
- Professor Asen Asenov, nanoCMOS Consortium (University of Glasgow)
Paul Jarvie, the NMI's conference organiser said, "When an underlying technology such as CMOS becomes in effect unreliable, a whole raft of critical questions are raised: How do design flows change? How can EDA tools adapt? How will we work with the foundry? How will the industry characterise and model variability? ICCV 2009 will address such questions and provide a unique opportunity to explore CMOS variability's far reaching implications for the semiconductor industry as a whole."
For further information and to register for ICCV 2009 "Living with Variability" visit: https://nmi.org.uk/