Nikon Instruments Releases New Microscopy System with NIS-Elements C Software

Nikon Instruments Inc., innovator of advanced optical instruments, today introduced the C2 Confocal Laser Point Scanning Microscope, which incorporates the newest release of NIS-Elements C software -Version 3.2.

By pairing these two powerful tools, researchers now benefit from this added usability and functionality in the new fully integrated C2 confocal system. The new system will be unveiled at the Neuroscience 2010 show in San Diego, Calif., taking place November 13-17, 2010.

The new functionality for the C2 Confocal Laser Microscope includes four channel confocal fluorescence imaging, with vastly expanded spectral capabilities over the predecessor instrument, the C1 Confocal. The new system can capture and unmix data acquired at any channel resolution across the entire detector bandwidth while electronics improvements increase scanning accuracy and speed.

"The combination of this new microscopy system and Nikon's NIS Elements software makes this one of the best confocal microscopes on the market," said Stephen Ross, General Manager, Marketing Department, Nikon Instruments. "Together, this system will facilitate work flow for scientists and give them full control of all their experimental parameters."

The new 3.2 version of NIS-Elements software supports the complete Nikon Instruments confocal family of products and includes customizable dialogs for device control and presets, as well as enhanced multi-camera support. It makes intensity correction possible through Z, combines extended depth-of-focus with high dynamic range. Z capture can also be merged with large image stitching. In addition, the new version allows for the definition of stage travel based on analysis results. New options are available for 2D and 3D deconvolution, as are new tracking tools linked with regions of interest. The software also offers numerous new options for data export.

Other confocal specific features include point scanning, super-resolution, the Nikon Ti-E research inverted microscope equipped with Nikon's Perfect Focus System (PFS), widefield CCD cameras, and an array of hardware devices.

NIS-Elements offers consistent interface and software environment for core imaging facilities and a variety of applications and techniques, allowing researchers to easily switch between confocal and widefield within the same platform. In conjunction with the specific confocal functionality, the NIS-Elements platform facilitates the entire workflow from live analysis and full control of all experimental parameters during acquisition, maximum and minimum intensity projections over time and Z-axis, Z depth display and volume rendering, image analysis, processing and data management.

The system is currently available.

Source: http://www.nikoninstruments.com/

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.