Qcept Technologies, the company that provides non-visual defect (NVD) detection solutions in semiconductor manufacturing, has secured an order for its ChemetriQ 5000 non-visual defect (NVD) inspection system from a semiconductor manufacturer based in North America.
The ChemetriQ 5000 will be used to carry out wafer inspection activities for advanced node front-end-of-line and back-end-of-line processes such as 2X-nm and 1X-nm.
The application of ChemetriQ 5000 will be at the unit processing stage as well as at integrated processing stage. Fabrication engineers will thus have at their disposal, a surface characteristic inspection system that monitors for defects at every step and also tracks the evolution of surface characteristics through the integrated process flow. Yield losses in manufacturing are often not traceable to a visible defect. The NVD system helps in detecting such defects and indentifying their source at an early stage of the manufacturing process. Robert Newcomb, Executive Vice president at Qcept Technologies stated that the ChemetriQ 5000 was ideal for their new customer as it can be incorporated into the manufacturing process without the need for changes. He also said that the recent order is an acknowledgement of NVD inspection system’s acceptance as a preferred solution for not just high-volume production but also for future generations of process development.
Source: http://www.qceptech.com/
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