Research and Markets has announced the addition of the "Global e-Beam Wafer Inspection System Market, 2018: Market Shares & SWOT Analysis of Key Vendors" report to their offering.
Currently, e-beam wafer inspection systems are being used in wafer inspection processes. It is expected that the systems will also be employed for three-dimensional through-silicon via inspection and extreme ultraviolet mask inspection during the forecast period. Thus, the increasing number of applications for the e-beam wafer inspection systems will tend to increase the customer base, which in turn will increase demand in the market. This is one of the major trends which will influence the growth in the market during the forecast period.
According to the report, one of the main drivers in this market is the increasing penetration of inspection systems. E-beam wafer inspection systems are gaining popularity among semiconductor manufacturers because of their accuracy and flexibility.
Further, the report states that one of the key challenges in this market is the cyclical nature of the Semiconductor industry that leads to fluctuations in the demand for e-beam wafer inspection systems. Moreover, in some cases the production of such equipment tends to exceed its demand.
Market Shares and SWOT Analysis for these vendors:
- Applied Materials Inc.
- ASML Holding N.V.
- Hermes Microvision Inc.
- Hitachi High-Tech Corp.
- KLA-Tencor Corp.
- Lam Research Corp.
Key Topics Covered:
01. Executive Summary
02. List of Abbreviations
03. Scope of the Report
04. Market Research Methodology
05. Introduction
06. Market Landscape
07. Geographical Segmentation
08. Key Leading Countries
09. Buying Criteria
10. Market Growth Drivers
11. Drivers and their Impact
12. Market Challenges
13. Impact of Drivers and Challenges
14. Market Trends
15. Trends and their Impact
16. Vendor Landscape
17. Key Vendor Analysis
For more information visit http://www.researchandmarkets.com/research/n5v3cp/global_ebeam
Source: http://www.researchandmarkets.com/