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Results 51 - 60 of 1806 for Measurement and analysis
  • Lake Shore Cryotronics Inc.
    Supplier Profile
    Supporting advanced research since 1968, Lake Shore Cryotronics is a leading innovator in measurement and control solutions for materials characterization under variable temperature and magnetic field...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Bruker BioAFM
    Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Micromeritics International Sales
    Supplier Profile
    Micromeritics Instrument Corporation is a leading global provider of solutions for material characterization with best-in-class instrumentation and application expertise in five core areas: ...
  • Micromeritics Instrument Corporation
    Supplier Profile
    Micromeritics Instrument Corporation is a leading global provider of solutions for material characterization with best-in-class instrumentation and application expertise in five core areas: ...
  • Anton Paar GmbH
    Supplier Profile
    Anton Paar Great people | Great instruments The “Anton Paar” success story began on January 4, 1922, when Anton Paar started his metalworking shop. Back then, it was hard to imagine that...
  • Hiden Analytical
    Supplier Profile
    2022 marks Hiden Analytical’s 40th year of continuous and independent operation in the field of mass spectrometry.  Driven by customer and application focussed innovation, a unique and...
  • New Statistical Analysis Technique Could Lead To More Precise And Reliable Measurement of Nanomaterials and Nanostructures
    News - 30 Jun 2009
    A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of...
  • k-Space Associates, Inc.
    Supplier Profile
    k-Space specializes in in-situ, real-time thin-film process monitoring tools. Since 1992 we have been developing quality integrated systems engineered to customer input and feedback. Our suite of...

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