Article - 26 May 2008
In this article spectroscopic ellipsometry was used to characterize both thicknesses and optical constants of TFT-LCD devices. Moreover the grain size of p-Si materials was investigated during the...
Article - 8 Jun 2010
The increasing number of autonomous miniature electronic devices brings with it the problem of an adequate, reliable power supply. Micropower environmental energy harvesting generators offer an...
Article - 20 May 2008
Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constants simply and accurately. This article illustrates the ability of the technique...
Article - 5 Oct 2006
Silicon is both a physically interesting and technologically important material having many applications. In recent years phase transformations during indentation have been of interest.
Article - 24 Nov 2010
In this paper we have shown that ICP-CVD can be used to deposit various materials including SiO2, SiNx,
a-Si and SiC. By using the ICP-CVD technique high quality films are deposited with high...
Article - 26 May 2005
Photonic crystals are optical materials with periodic changes in the dielectric constant on a length scale comparable to optical wavelengths. Dimensional types of photonic crystals, parallelism,...
Article - 23 Nov 2010
By using the ICP-CVD technique, Oxford Instruments have developed a deposition process in which high quality films can be deposited with high density plasma, low deposition pressures and temperatures.
Article - 10 May 2013
There are numerous nano-related research projects currently underway in New Jersey and this state appears quite active in the field. There is a concentrated effort in the medical/pharmaceutical which...
Article - 15 Dec 2010
Continuous exposure of personnel to explosion shock waves has been known to cause internal damage that can lead to irreparable damage if not detected early and hence the need to design sensors that...
Article - 15 Aug 2018
This article is based on a talk by Professor Alexander Seifalian from NanoRegMed Ltd, UK, at the NANOMED conference in Manchester (June 2018).