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  • Supplier Profile
    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Supplier Profile
    Nanosurf is a leading manufacturer of atomic force microscopes and scanning tunneling microscopes. Our full range of AFM and STM products is trusted by professionals worldwide to help them visualize,...
  • Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative instrumentation...
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    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Supplier Profile
    Applied NanoStructures, Inc. develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. They leverage extensive...
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    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in...
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    Scanwel is your authorised distributor of high quality Scanning Probe Microscope (SPM) accessories from NT-MDT. In Scanning Probe Microscopy, the perfect instrument is only half of the story. The...
  • Supplier Profile
    If your AFM data is important to you, put your trust in Carbon Design Innovations. We're experts in the production of carbon nanotube AFM probes, sensors and array devices. What sets us apart is...
  • Supplier Profile
    Founded by Nanotechnology pioneer Dr. Olaf Ohlsson, Nanosensors heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy). For more than ten years...