Scanwel is your authorised distributor of high quality Scanning Probe Microscope (SPM) accessories from NT-MDT.
In Scanning Probe Microscopy, the perfect instrument is only half of the story. The probe is equally important.
NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others. To keep your instrument properly calibrated, Scanwel Probes carry an extensive array of multiple calibration gratings as well as test samples with free deconvolution software. A range of substrates and test samples for SPM completes their product range. To ensure that NT-MDT can offer you the most advanced probes to supplement their product line, now and in the future, they've made probe development a key component of their R&D program.
SPM Probe Supplier
NT-MDT Probes for CONTACT/SEMICONTACT from Scanwel
Super Sharp 1nm NT-MDT AFM Probes from Scanwel
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