Scanwel is your authorised distributor of high quality Scanning Probe Microscope (SPM) accessories from NT-MDT.
In Scanning Probe Microscopy, the perfect instrument is only half of the story. The probe is equally important.
NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others. To keep your instrument properly calibrated, Scanwel Probes carry an extensive array of multiple calibration gratings as well as test samples with free deconvolution software. A range of substrates and test samples for SPM completes their product range. To ensure that NT-MDT can offer you the most advanced probes to supplement their product line, now and in the future, they've made probe development a key component of their R&D program.
SPM Probe Supplier
NT-MDT Probes for CONTACT/SEMICONTACT from Scanwel
Super Sharp 1nm NT-MDT AFM Probes from Scanwel
Professor Andre Nel
In this interview, AZoNano speaks with Professor Andre Nel about his involvement in innovative research describing the development of a 'glass bubble' nanocarrier that could help drug formulations access pancreatic cancer cells.
Jingang Li, Ph.D.
In this interview, AZoNano speaks with Jingang Li from the University of California, Berkley, who offers an introduction to the Nobel Prize-winning technology, Optical Tweezers.
Steve Kosier, Ph.D.
In this interview, we speak with SkyWater Technology about the current state of the semiconductor industry, how nanotechnology has helped to shape this sector, and their new partnership which aims to increase the accessibility of semiconductor chips for start-ups and research groups across the Unite
NMR spectroscopy is a characterization technique that is extensively used by chemical researchers.
Inoveno’s PE-550 is a best-selling electrospinning/spraying machine that can be used for the continuous production of nanofibers.
The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.