News - 1 Apr 2010
CEA-Leti, a leading global research center committed to creating and commercializing innovation in micro- and nanotechnologies, said today that its Hybrid Metrology Project has developed a way to...
News - 25 Aug 2020
In a paper published in NANO, a team of researchers from Xinjiang University, China have prepared [email protected]
photocatalyst with core-shell structure by combining coal-based carbon dots (CDs) with gold...
News - 31 Mar 2016
As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer capable of examining surface features,...
News - 17 Sep 2014
Nova Measuring Instruments, a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that a leading logic...
News - 18 Mar 2014
Researchers at UPM are experimenting the introduction of aluminum optical nanosensors on the surface of common compact disc for facilitating analysis by using CDs and DVDs players.
News - 22 Jun 2011
Keithley Instruments has introduced compact discs (CD) that provide all the information obtained from its nanotechnology-focused webinars and tutorials.
The webinars on the CD are categorized into...
News - 12 Nov 2010
Advantest Corporation (TSE: 6857, NYSE: ATE) today announced availability of its new SEM-based Critical Dimension (CD) measurement system for next-generation photomasks and patterned media.
News - 13 Jul 2010
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD.
The content of this...
News - 13 Jul 2010
Applied Materials, Inc. today unveiled its new Applied Centura® AdvantEdge™ Mesa™ system for creating nano-scale circuit features with angstrom-level precision in next-generation DRAM, Flash and...
News - 13 Oct 2009
Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today...