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Results 1 - 10 of 15 for Conductive AFM
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Supplier Profile
    Founded by Nanotechnology pioneer Dr. Olaf Ohlsson, Nanosensors heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy). For more than ten years...
  • Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
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    Combining different analytical methods into one instrument is of great importance for the simultaneous acquisition of complementary information. Here at Quantum Design Microscopy we combine two of the...
  • Supplier Profile
    Our pursuit is progress for people everywhere. That's why we take a closer look at things, ask questions, and think ahead. We've been around for more than 350 years, yet our majority owners...
  • Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • Supplier Profile
    CSInstruments is a French scientific equipment manufacturer specialized in the conception of Atomic Force Microscope and options designed for existing AFM (Resiscope, High Voltage Amplifier, Magnetic...

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