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Results 1 - 10 of 210 for Nanoscale topography
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
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    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
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    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
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    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
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    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
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    CSInstruments, a French manufacturer of scientific equipment, specializes in developing Atomic Force Microscopes (AFMs) and various accessories for existing AFMs, such as the Nano-Observer AFM,...
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    Oxford Instruments WITec pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without...
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    JEOL USA is a wholly-owned subsidiary of JEOL Ltd in Japan, a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core...
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    FemtoTools, part of Oxford Instruments, is a Swiss high-tech company specializing in high-resolution, MEMS-based nanoindenters for applications in metallurgy, thin films, and microsystems...

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