Article - 24 Feb 2004
US Global Nanospace, Inc. and Cyclone Aviation Products, Ltd., a subsidiary of Elbit Systems Ltd., today announced a manufacturing agreement for production of the US Global S.A.G. Humvee turret....
News - 14 Aug 2015
As a nanopositioning and motion control systems leader, PI’s (Physik Instrumente) PInano™ super resolution (SR) microscope stage series is available in two variations - High Precision with...
News - 20 Jun 2011
PI (Physik Instrumente) LP has added two higher-performance models to its successful PInano superresolution (SR) microscope stage series.
Higher Stability and Reduced Noise with Capacitive...
Article - 17 Aug 2005
Characterisation and analysis tools let material scientists examine the behaviour and properties of materials at the nanoscale. Studying the effects of particle size on the fluoresence properties of...
Article - 2 Jan 2004
Lambda Photometrics introduce the Physik Instrumente P-721.CLQ PIFOC® Nano-Focus Device for applications such as scanning microscopy, cell tracking and surface profiling. Posted December 2003
News - 4 May 2010
Carl Zeiss offers the Axio Imager Vario microscope module in particular for tasks in industry where large samples such as solar cells, wafers, flat panel screens or printed circuit boards have to be...
Article - 23 Feb 2004
Nano-technologies are being used to make the Marine Corps’ future Marine air-ground task force (MAGTF) expeditionary family of fighting vehicles (MEFF-V) lighter, tougher, and smarter. Posted Decmber...
Article - 7 Jan 2004
US Global Nanospace has announced that the new Guardian Antiballistic Replacement Door Skin (GARDS) for the AM General HMMWVV (commonly pronounced Hum-Vee) are now available. GARDS are lightweight and...
News - 23 Jun 2010
Veeco Instruments Inc., the leading provider of scanning probe microscopes (SPM) to the nanoscience community announces the BioScope Catalyst Perfusing Stage Incubator to facilitate cell biology...
Article - 26 Dec 2012
In the LED, semi-conductor, automotive and medical sectors, surface metrology and characterization is an important criterion to ensure product performance in a wide range of applications.