Zyvex Announces F100 Nanomanipulator for Focused Ion Beam Instruments - New Product

Zyvex Corporation, a leading nanotechnology company commercializing innovative tools, products and services, today announced the sales release of the F100 Nanomanipulator System, a positioning and testing tool for research, development, and production applications using Focused Ion Beam (FIB) instruments. The product enables users to manipulate and test semiconductor devices and other materials in situ, improving the quality and reducing failure of integrated circuits. The device, which uses microgrippers to improve sample handling, is useful in nano- and microscale sample preparation for Transmission Electron Microscopes (TEMs).

The F100 provides three-dimensional positioners which grasp, move, test, and optimally position micro- and nanoscale samples. The positioners offer up to five degrees-of-freedom positioning capability. An easy-to-use joystick and illuminated keypad provide an unparalleled degree of control and resolution at the nanoscale.

“The launch of the F100 is an expansion of our nanomanipulation product line initially developed in 2002. Our S100 Nanomanipultor is currently used by research and industrial customers in scanning electron microscopes (SEMs) and with the Zyvex Optical Docking Station for optical microscopes,” noted Zyvex’s Chief Operating Officer, Thomas A. Cellucci, Ph.D., MBA. “Our platform strategy leverages current microscopy instrumentation, while setting the stage for a new generation of microassembly and analysis systems. We feel confident that this will be a winning product since it has already attracted significant interest from several FIB equipment manufacturers.”

The F100 is available in both bottom-mount and top-mount configurations for a variety of FIBS from leading vendors.

These products are an integral part of Zyvex’s mission of providing flexible, automated manufacturing at ever decreasing size scales.

Posted 9th October 2003

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