| Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, has developed a Nanotech Toolkit, a set of measurement software tools designed specifically for a variety of tests common to nanotechnology researchers to assist them in making the very precise, often complex electrical measurements associated with nanotechnology. The Nanotech Toolkit and its software routines are available at no charge and are compatible with Keithley's Model 4200-SCS Semiconductor Characterization System. Measurements at the nanoscale level are challenging even for those trained in electrical measurements, while many of the chemists, biologists, and physicists often working in nanotech labs have less formal training in measurement science. The Nanotech Toolkit is designed to shortcut many measurement tasks by providing common routines typically used in testing nanotech devices. Included in the Nanotech Toolkit are icons that represent Model 4200-SCS measurement routines for testing a carbon nanotube-based transistor, a bio-component, a molecular transistor, a molecular wire, a nanowire, and a nanocell. For example, there are tests that plot the I-V (current vs. voltage) curves of carbon nanotubes and molecular transistors, and other tests that make differential conductance measurements for high resistance/low resistance measurements on nanowires. The Nanotech Toolkit is distributed on a CD, which also contains a collection of relevant white papers, application notes, data sheets, and a seminar on making accurate nanotech electrical measurements. The Model 4200-SCS Semiconductor Characterization System offers sub-femtoamp (10 -15) current measurement resolution. The Model 4200-SCS is being used in nanotech research facilities around the world because of its ability to make extremely sensitive measurements, open architecture, and ease of use, making it well suited for applications such as current-voltage characterization of carbon nanotube electronics, molecular electronics, optoelectronics, and materials research. |