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Hitachi Developed New Type of Field Emission Scanning Electron Microscope

Hitachi High-Technologies Corporation has developed the SU8000, a new type of Field Emission Scanning Electron Microscope (FE-SEM) that features a newly developed top detector. The SU8000 was introduced on August 1.

8 Aug 2008

Nanoscale Atmospheric Aerosol Species Being Ignored in Climate Computer Models

Arizona State University researchers have made a breakthrough in understanding the effect on climate change of a key component of urban pollution. The discovery could lead to more accurate forecasting of possible global-...

8 Aug 2008

Defining Exactly What Happens When Ice Freezes

"Ye canna change the laws of physics!" Scotty warned Captain Kirk on "Star Trek." But engineers and physicists at the University of Maryland may rewrite one of them.

6 Aug 2008

Scientists from Europe and Canada are Studying Tiny Gold Nanoparticles

Scientists from Germany, Canada and the Netherlands have studied tiny gold nanoparticles, so-called clusters, and found them to have fascinating arrangements of their constituent atoms.

5 Aug 2008

Scientists Developed Process for Cleaning a Transmission Electron Microscope

A process for cleaning a transmission electron microscope without disassembling has been developed. Contaminants in the electron microscope are removed, and 100% performance is demonstrated. The accuracy and reliability of analyzing organic and polymeric materials at the nanometer level are improved.

5 Aug 2008

Eliminating Metal Nanoparticles Result in a More Corrosion-Resistant Alloy

Oxide scales are supposed to protect alloys from extensive corrosion, but scientists at U.S. Department of Energy's Argonne National Laboratory have discovered metal nanoparticle chinks in this armor. Oxide scales...

5 Aug 2008

ORION PLUS from Carl Zeiss Redefines What's Possible in High End Microscopy

At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS.

From Carl Zeiss Microscopy GmbH 5 Aug 2008

Carl Zeiss SMT Offering Additional Argon Ion Beam Column to NVison 40

To enable the production of highly polished TEM lamellas Carl Zeiss SMT now offers an additional Argon ion beam column to its successful NVison 40 CrossBeam workstation.

From Carl Zeiss Microscopy GmbH 5 Aug 2008

Carl Zeiss SMT Showcases a New Class of SEM at Microscopy Exhibition

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

From Carl Zeiss Microscopy GmbH 5 Aug 2008

Carl Zeiss SMT Introduces Major Upgrade to LIBRA 120 EFTEM

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a major upgrade of its LIBRA® 120 Energy Filter Transmission Electron Microscope (EFTEM).

From Carl Zeiss Microscopy GmbH 5 Aug 2008