Nanooptics and Nanophotonics News

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Six Micrograph Contest Winners Announced at EIPBN Conference

The 52nd International Electron Ion and Photon Beam Technology and Nanofabrication (EIPBN) Conference announced six Micrograph Contest winners at its annual Conference held this year in Portland, Oregon May 27-30. The...

20 Jun 2008

Collaboration Focusing on Developing Reliable Print Manufacturing Processes

Thin Film Electronics ASA InkTec Co.,Ltd. headquartered in Kyungki-do, Korea, a research and manufacturing company in the field of Printed Electronics, and Thin Film Electronics ASA of Oslo, Norway, announces today that ...

19 Jun 2008

Adding Color to Magnetic Resonance Imaging

Customized microscopic magnets that might one day be injected into the body could add color to magnetic resonance imaging (MRI), while also potentially enhancing sensitivity and the amount of information provided by images.

19 Jun 2008

Creating Nano-Scale Patterns on Uneven Surfaces

Princeton engineers have invented an affordable technique that uses lasers and plastic beads to create the ultrasmall features that are needed for new generations of microchips.

19 Jun 2008

New Type of Solar Energy System Four Times more Cost-Efficient

Transparent transistors and optoelectronics created by researchers at Oregon State University and HP have found their first key industrial application in a new type of solar energy system that its developers say will be four times more cost-efficient than any existing technology.

18 Jun 2008

Take a Little Bit of Carbon, Throw in Some Epoxy and Add Lots of Lunar Dust

Scientists working at NASA's Goddard Space Flight Center in Greenbelt, Md., have concocted an innovative recipe for giant telescope mirrors on the Moon. To make a mirror that dwarfs anything on Earth, just take a little bit of carbon, throw in some epoxy, and add lots of lunar dust.

18 Jun 2008

Laser Calibration System Setting New Industry Standard

Agilent Technologies Inc. today introduced a new Dynamic Calibrator, a laser-based calibration system for measuring machine-tool and coordinate-measuring-machine (CMM) accuracy. New sensors in the system offer accuracy to 0.4ppm, setting a new industry standard.

18 Jun 2008