Put steel under a powerful microscope, revealing its microstructure, and prepare to be surprised. Known for its strength, the metal will appear pitted and pocked."It is intrinsic to the material," says Carolyn Aita, a Wisconsin Distinguished Professor at the University of Wisconsin-Milwaukee (UWM). "A pit can begin to develop from a physiochemical defect in the steel itself."
Asylum Research announced that it will present a session on its NanoIndenter System at the AVS Conference and Exhibition in Boston, MA on October 21 at 12:20 in the Exhibitor Workshop area of the main exhibit hall. Asylum Application Scientist, Keith Jones, will present "Combining AFM and Instrumented Nanoindentation for Mechanical Characterization of Materials at the Nanoscale."
From buttons to storage bins, the molding of polymers is big business. At the nanoscale, processes such as nanoimprint lithography squeeze polymers to form patterns during the manufacture of semiconductor devices, organi...
Small-tech veteran Monteith G. Heaton has recently joined Asylum Research as Executive Vice President of Marketing and Business Development for Asylum's line of atomic force and scanning probe microscopes (AFM/SPM).
Edith Cowan University’s (ECU) School of Engineering is gearing up for the first intake of Mechanical Engineering students next year with the installation of a high-tech new nanoindenter at the state-of-the-art Mat...
Micro Materials have been making innovative nanoscale test instrumentation for more than twenty years. Centre to their range is the NanoTestT platform which offers options to study a wide variety of materials properties. While many systems have made measurements under ambient conditions, Micro Materials have recognized that environmental testing is key when evaluating true "in-use" performance characteristics.
The Nanoindentation Tester (NHX) from CSM-Instruments is the perfect low-cost solution for measuring HARDNESS and ELASTIC Modulus in accordance with ISO 14577 and ASTM 2806. Using our extensive experience – gained ...
Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a mechanical fatigue process that eventually leads to cracks and breakdown in bulk silicon crystals—a phenomenon that&rsquo...
NANOIDENT Technologies AG, the world leader in printed semiconductor-based optoelectronic sensors, announced achievement of ISO 9001:2000 certification for the NANOIDENT Group of companies, which includes NANOIDENT Techn...
While government leaders argue about the practicality of reducing world emissions of carbon dioxide, scientists and engineers are seeking ways to make it happen.
One group of engineers at MIT decided to focus its work...