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Joint Patterning Center of Excellence Launched by SEMATECH and SUNY CNSE/SUNYIT

Joint Patterning Center of Excellence Launched by SEMATECH and SUNY CNSE/SUNYIT

Pt/TiOx (5nm)/ZnO/n+-Si Structure Demonstrates Optimal Resistive Switching Characteristics

Pt/TiOx (5nm)/ZnO/n+-Si Structure Demonstrates Optimal Resistive Switching Characteristics

UMC Licenses Cypress’s SONOS Embedded Flash Memory IP for 55-nm Process Technology Node

UMC Licenses Cypress’s SONOS Embedded Flash Memory IP for 55-nm Process Technology Node

Department of Defense Accredits Novati’s Austin Wafer Fabrication Facility as Category 1A Trusted Foundry

Department of Defense Accredits Novati’s Austin Wafer Fabrication Facility as Category 1A Trusted Foundry

RFaxis to Unveil Family of Nano RF Front-Ends in 40nm CMOS Process

RFaxis to Unveil Family of Nano RF Front-Ends in 40nm CMOS Process

SMIC's 55nm LL eFlash Platform-Based 55nm Smart Card Chip Launched by HED

SMIC's 55nm LL eFlash Platform-Based 55nm Smart Card Chip Launched by HED

Altera Releases Early Access Design Software for 14-nm FPGAs

Altera Releases Early Access Design Software for 14-nm FPGAs

IMTS 2014: KERN to Highlight Ultra- and Nano-Precision Machine Tool Technology

IMTS 2014: KERN to Highlight Ultra- and Nano-Precision Machine Tool Technology

U.S. GAO Chief Scientist Tours NanoMech's Springdale and Fayetteville Facilities

U.S. GAO Chief Scientist Tours NanoMech's Springdale and Fayetteville Facilities

Xerox Research Centre Canada Issued US Patent for Graphene Nano-Sheets

Xerox Research Centre Canada Issued US Patent for Graphene Nano-Sheets

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