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Applied Materials Most Advanced Defect Review System, the Applied SEMVision G4, Extends Technology and Productivity to 45 nm and Beyond

DOE Contract Awarded for Scaleable Manufacturing of Carbon Nanotube Based Field Emission Sources for use in Scanning Electron Microscopes and Transmission Electron Microscopes

Veeco Introduce 3D Automated Atomic Force Microscope (AFM) Platform

Clemson Researchers Find way to Make Computer Chips Cooler, Faster and Cheaper

Nanotechnology May Mean Email Spam Turns into Actual Unwanted Products on Your Work Desk

Various Nanotechnology Related Advances in Electric Vehicle Technology to be Presented at Electric Vehicle Symposium

Nano Biotechnology Firm to Develop Medical Patient Diagnosis Device

Applied Materials has Announced its new Applied FullVision System that Enables Real Time Control of Dielectric CMP Processes to the 45nm Device Node and Beyond

SiGNa Chemistry Named as a World Economic Forum Technology Pioneer for Transformational Green Chemistry Based on Nano-scale Encapsulation of Reactive Metals

Cima NanoTech Selected as a 2008 Technology Pioneer by the World Economic Forum for Advancing the Field of Nanomaterials in Electronic Applications

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