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Applied Nanotech Showcases Key Nanotechnology Advancements at Nano Tech 2010

Applied Nanotech Holdings, Inc. (OTC BB: APNT) announced that it will showcase some of its key nanotechnology advancements at nano tech 2010 held February 17-19 in Tokyo, Japan at Tokyo Big Site. ANI will highlight its printed electronics, sensor technology, and composites.

At its booth, ANI will demonstrate RFID antennas that have been inkjet printed on paper and plastic using conductive copper ink. ANI will have a RFID testing system set up at the booth such that nano tech 2010 attendees will have the opportunity to test the RFID antennas for themselves.

Another interactive display will feature a highly sensitive sensing device being developed for health monitoring via breath analysis. The components of an individual’s breath can be considered a blue print of one’s health, and can reveal ailments at a very early stage in a non-invasive manner. Breath analysis has the potential to significantly reduce health care costs by identifying potential health problems early.

CNT enhanced ballistic resistant fiberglass composite panels, CNT enhanced epoxy and carbon fiber composites, and anti-static nylon created using carbon nanotubes will be on display. ANI’s patent pending composite technology results in materials with significantly improved properties tailored to particular applications.

ANI will also be featured in the technical poster sessions. The two technologies being highlighted are Carbal™, a nano engineering thermal management material to improve reliability, efficiency and lifetime of Concentrator Photovoltaic (CPV) cells, and a copper nanoparticle paste as a low cost replacement for solders in hybrid electric vehicle power electronics that enables higher system operating temperatures, improved device reliability, and reduced thermo-mechanical stress to dies and devices during thermal cycling.

The International Nanotechnology Exhibition and Conference nano tech 2010 is the largest of its kind in the world with 50,000 participants anticipated. For more information about the conference and expo, please see

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