Elucidating structural parameters of nanomaterials will be the hot topic at the upcoming workshop ‘X-ray Scattering Methods for Characterization of Nano-Materials’, to be held on December 3, 2010 during the MRS Fall 2010 conference in Boston, MA.
“This workshop is a unique opportunity to gain knowledge from the experts in the field about the latest X-ray analytical tools available to scientists and engineers for materials characterization”, states Dr. Robert L. Snyder, Professor and Chair of the School of Materials Science and Engineering at the Georgia Institute of Technology. Prof. Snyder is co-organizer of the workshop along with Dr. Iuliana Cernatescu, Principal Scientist at PANalytical Inc.
The aim of this workshop is to give the attendees insight into valuable characterization tools to help unravel nanostructural parameters of samples and/or devices by using X-ray diffraction and scattering techniques. Leading experts on each scattering method will give a practical tutorial on how to apply different scattering methods to nanomaterials characterization and what parameters can be extracted from each method. Invited instructors include: Prof. Z. L. Wang and Prof. Robert L. Snyder of Georgia Institute of Technology, Dr. Thomas Proffen of Los Alamos National Laboratory, Dr. Andrew Payzant of the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory, Dr. Hans te Nijenhuis of PANalytical B.V, the Netherlands and Dr. Iuliana Cernatescu of PANalytical Inc., USA. The workshop will conclude with a field trip to tour PANalytical’s Applications Laboratory in Westborough, MA where the participants can see the latest developments in X-ray diffraction laboratory systems.
Researchers, scientists, academics, industrial laboratory staff, engineers, educators and leading professionals in the field of nanotechnology, synthesis and applications of nanomaterials, thin film, energy storage materials, solar cells, H-storage materials, batteries and advanced materials will be able to learn how classical and novel X-ray diffraction and scattering methods can help in their work.
Registration for this workshop is possible from the website for MRS Fall 2010.