Posted in | Nanomaterials | Nanoanalysis

STOE Announce New Module for WinXPOW Powder Diffraction Software

STOE's WinXPOW software now includes a new module for easy evaluation of powder diffraction measurements - SYSTEVAL.

SystEval combines all tasks for the evaluation of a powder diffraction measurement now in one
application: background modeling, peak searching and editing, full pattern fitting, indexing and
determination of the extinction symbol. All in one user friendly application.

The application incorporates the accepted algorithms of ITO, TREOR and DICVOL for indexing, and ExtSym for the extinction symbol determination. Also implemented are the peak-search and pattern-fitting algorithms, already present in the WinXPOW software package. The combination of the powerful peak-search and pattern-fitting algorithms ensures that the steps of indexing and determination of the extinction symbol can work with the most accurate peak position and intensities.

The modern graphical user interface facilitates that every command or parameter is only a mouse click away. The user has a complete overview over the evaluation process at every time, either graphical or with detailed reports.

The SystEval application offers a user friendly “Guided Mode” where the user is taken step by step through all evaluation steps. In this mode most of the algorithm parameters are kept under the hood and the application will determine the most adequate parameters for each step.

But full control over every evaluation step is also only a mouse click away: the “Advance Mode” offers the user access to the important parameters, and allow quick adjustment of the parameters to their needs. So the user keeps full control over the evaluation process.

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