Search

Search Results
Results 1151 - 1160 of 1260 for Scanning electron microscopes
  • TEM and Nanomedicine: Insights into Drug Delivery and Targeting
    Article - 20 Nov 2023
    Nanomedicine has demonstrated great efficacy in delivering an array of therapeutic compounds into the body's target sites. Here, we discuss the application of TEM in nanomedicine for drug discovery...
  • Redefining Nanoscale Analysis with FusionScope
    Article - 5 Oct 2023
    In this interview, AZoNano speaks with Chris Schwalb about SEM, AFM, and the development and significance of FusionScope in the realm of nanoscale analysis.
  • Analyzing Semiconductor Nanodevices Through Spectroscopy
    Article - 15 Sep 2023
    In the world of semiconductor nanodevices, where quantum effects and atomic positions dictate behavior, spectroscopic techniques emerge as powerful tools to unlock their quantum properties and explore...
  • High Vacuum C-AFM Imaging
    Article - 7 Sep 2023
    Utilizing high vacuum C-AFM imaging, this study reveals the relationship between nanoscale structure and electrochemical activity in energy storage systems.
  • Two-Photon Microscopy | A Guide
    Article - 16 Aug 2023
    Two-photon microscopy is a type of fluorescence microscopy that, rather than exciting the sample with a single photon, makes use of multiple photons.
  • Bex - Breakthrough Into Imaging Techniques
    Article - 29 Sep 2023
    In this interview, AZoNano discusses the Unity - BEX imaging technique with Heithem Mansour and explores the features of Unity that make it an ultimate imaging technology.
  • Applications of Industrial Metrology
    Article - 24 Jul 2023
    Industrial metrology ensures the conformity and validity of production in any industry to meet global standards. This article demystifies the concept of industrial metrology and delves into its...
  • EDS Analysis at the Nano-scale in an SEM
    Article - 23 Nov 2023
    This article from Carl Zeiss details how nano-scale EDS analysis was accomplished in an SEM with a detector for transmission SEM.
  • Exploring Microelectronic Circuit Voltage Contrast
    Article - 22 Nov 2023
    This article from Carl Zeiss discusses voltage contrast in a microelectronic circuit.
  • What is Metrology?
    Article - 27 Jun 2023
    This article provides an overview of metrology, exploring its historical roots, diverse techniques, and profound impact on shaping industries and enabling accuracy and precision in various fields.

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback