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Results 331 - 340 of 1383 for Afm
  • Article - 13 Jan 2023
    AFM excels in measuring high spatial frequency roughness (HSFR) on very smooth surfaces, crucial for semiconductor and EUV optics industries.
  • Article - 12 Sep 2019
    In this case study, the high-speed AFM was used in combination with STED super-resolution optical microscopy to visualize DNA nanostructures.
  • Article - 27 Aug 2013
    Measuring and mapping mechanical properties of live biological cells is crucial in today's research. Although atomic force microscopy is mainly used to produce a 3D profile of the scanned surface, it...
  • Article - 4 Jan 2013
    In the LED, semi-conductor, automotive and medical sectors, surface metrology and characterization is an important criterion to ensure product performance in a wide range of applications. These...
  • Supplier Profile
    For the last 46 years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we approach our...
  • Supplier Profile
    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
  • Supplier Profile
    PrimeNano manufactures its own shielded probes. We use a wafer scale MEMS fabrication process to manufacture probes with co-axially shielded cantilevers and solid metal probe tips. The probes are...
  • Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • Supplier Profile
    TMC is a global leader in precision floor vibration isolation systems with over 50 years of experience. Major research centers, OEM and end-user semiconductor manufacturers, drug discovery companies,...
  • Article - 10 Mar 2022
    This article presents the advancement of MEMS nanoindenterfor AFM probes for nanomechanical analysis of soft materials.

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