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Results 71 - 80 of 510 for Cantilevers
  • Article - 17 Feb 2006
    This article serves as a basic introduction to the design and operation of an atomic force microscope. It covers basic concepts and technologies that help understand the construction and operation of...
  • News - 3 Jun 2015
    Working with a device that slightly resembles a microscopically tiny tuning fork, researchers at the University of Tsukuba in Japan have recently developed coupled microcantilevers that can make mass...
  • Article - 18 May 2012
    Atomic force microscopy (AFM) is a technique used to characterize surfaces at extremely high resolution by scanning a sharp probe across the surface.
  • Article - 2 Feb 2022
    PFM reveals nanoscale electromechanical traits in piezoelectric materials, crucial for tech innovation.
  • Equipment
    Hiden Analytical’s PSM is a plasma probe that measures some of the key plasma parameters and offers detailed information regarding plasma reaction chemistry.
  • Equipment
    SensaProbes are highly recommended for early stage scans and student use. Applied NanoStructures SensaProbes can be used for tapping and contact mode and force modulation applications.
  • Equipment
    NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
  • Equipment
    Our most versatile tip. It delivers excellent results in almost all AFM applications.
  • Supplier Profile
    TMC is a global leader in precision floor vibration isolation systems with over 50 years of experience. Major research centers, OEM and end-user semiconductor manufacturers, drug discovery companies,...
  • Supplier Profile
    Nanonics Imaging is the premier innovator of AFM and NSOM systems in the SPM market. Since its inception in 1997 and throughout the last fifteen years Nanonics have introduced to the SPM market new...

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