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  • Supplier Profile
    Arc Nano provide, develop, and manufacture extremely high technology parts, critical components, tooling and subsystems. ARC has a state-of-the-art manufacturing facility with capabilities spanning...
  • Supplier Profile
    Thermo Fisher Materials and Structural Analysis products give you outstanding capabilities in materials science research and development. Driving innovation and productivity, our portfolio of...
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    Aquila Instruments manufactures the nkd, the most advanced thin film measurement instrument available. The nkd provides non destructive analysis of film thickness, refractive index and absorption for...
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    COSDAF was established in 1998, with Professor Shuit-Tong LEE as the founding director, under the enthusiastic support of City University of Hong Kong (CityU), Research Grants Councils, Innovation and...
  • Supplier Profile
    COSDAF was established in 1998, with Professor Shuit-Tong LEE as the founding director, under the enthusiastic support of City University of Hong Kong (CityU), Research Grants Councils, Innovation and...
  • Supplier Profile
    DCA Instruments is a company specializing in the design and manufacture of Molecular Beam Epitaxy (MBE) and UHV thin film deposition systems and components. DCA is a Finnish company located in Turku,...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Supplier Profile
    k-Space Associates, Inc. is a leading global supplier of advanced metrology systems for thin-film and industrial metrology applications. k-Space serves over 1,000 companies, government agencies and...
  • Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Equipment
    The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.

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