Nanoscience Instruments is your one source for a variety of AFM systems, probes, accessories, and related nanoscience tools.
Products include the easy-to-use Nanosurf® easyScan 2 AFM/STM and...
Article - 28 Mar 2011
Huang et al. produced some astonishing images of graphene grains that resembled a patchwork quilt. To obtain these images the researchers used TEM and diffraction-filtered imaging to show the...
News - 17 Oct 2011
The AVS 58th International Symposium & Exhibition will be held Oct. 30 - Nov. 4, 2011, at the Nashville Convention Center in Nashville, Tenn. More than 1,200 talks will be delivered on...
Article - 14 Nov 2007
A new promising material is molybdenum-sulfur-iodine nanowires. This article is a brief overview of atomic and electronic structure of molybdenum-sulfur-iodine molecular nanowires.
Article - 30 May 2016
Scanning TEM (STEM) imaging and energy dispersive x-ray spectroscopy (EDS) are conventional methods employed for characterizing, and for extracting specific composition information from, Pd/Au alloys...
Article - 7 Jun 2011
Silver nanoparticles have unique optical, electrical, and thermal properties and are being incorporated into products that range from photovoltaics to biological and chemical sensors. Described herein...