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Results 1 - 10 of 94 for SNOM
  • Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Supplier Profile
    K-Tek Nanotechnology LLC, a distributor of AFM accessories, supplies the most well known and latest technology the SPM industry has to offer. With proven quality and competitive pricing, our products...
  • Supplier Profile
    Scanwel is your authorised distributor of high quality Scanning Probe Microscope (SPM) accessories from NT-MDT. In Scanning Probe Microscopy, the perfect instrument is only half of the story. The...
  • Supplier Profile
    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...
  • Supplier Profile
    piezosystem jena is a worldwide supplier of high precision nanopositioning equipment. Our piezoelectric ceramic based actuating systems and stages are mainly used for micro positioning and...
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    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
  • Supplier Profile
    MS MacroSystem offers professional 3D and 4D graphics software for science and technology that allows you to analyze data quickly and accurately. Our unique set of interactive 3D measurement...
  • Supplier Profile
    Over the last 25 years, NT-MDT has been involved in the development, production and support of research instrumentation, primarily, atomic force microscopes (AFM) and its combinations with ultrahigh...
  • Article - 23 Jun 2010
    SNOM is the acronym for Scanning Near-Field Optical Microscopy, an alternative name for NSOM (Near-Field Scanning Optical Microscopy). The resolution achieved is far better than that which...
  • Article - 21 Jan 2008
    This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy.