cyberTECHNOLOGIES is dedicated to providing its clients with industry leading high-resolution, non-contact 3D measurement systems. The advanced systems are widely utilized for industrial and scientific applications. The high resolution optical sensor, either laser-based or with a white and infrared light source, together with the specifically designed highly precise x/y scanning stage and sophisticated software, is the core of the system and produces reliable and dependable results.
The non-contact 3D measurement systems from cyberTECHNOLOGIES are widely used in microelectronics and other precision industries for a vast array of applications, including waviness measurement, contour measurement, roughness measurement, step height measurement, solar cell measurement, TTV measurement and much more.
CT100 Non-Contact 3D Profilometer from Cyber Technologies- MRS 2012
Professor Andre Nel
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In this interview, AZoNano speaks with Jingang Li from the University of California, Berkley, who offers an introduction to the Nobel Prize-winning technology, Optical Tweezers.
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The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.