The DektakXT™ stylus profiler from Bruker features a revolutionary design that enables unmatched repeatability of under five angstroms (<5Å) and up to 40% improved scanning speeds. This major milestone in stylus profiler performance is the culmination of Dektak®'s forty-year legacy of innovation and industry leadership.
Through a powerful combination of industry firsts including a unique single-arch design and smart electronics for unmatched repeatability and performance, HD true color camera for enhanced image resolution and clarity, and a 64-bit parallel processing software architecture for accelerated analysis and best-in-class ease-of-use, DektakXT delivers ultimate performance and efficiency to accelerate advances in materials research and product quality. The remarkable breakthroughs incorporated in this tenth-generation Dektak system enable the critical nanometer-level film, step and surface measurements that will power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.
Unmatched performance and better than 5Å repeatability
- Single-arch design provides breakthrough platform stability
- Leading-edge "smart electronics" establish new low-noise benchmark
- New hardware configuration offers 40% shorter collection times than prior generations
Unprecedented efficiency and ease of use
- Intuitive Vision64™ user interface workflow simplifies operation
- Single sensor design enables the widest range of capabilities in a single platform
- Self-aligning styli enables effortless tip exchange
Incomparable value from the world leader in stylus profilers
- Bruker delivers premier performance in an affordable package
- Full complement of accessories extend versatility and tailor system to your application