Photoconductive AFM (pcAFM) Module for Dimension Icon Atomic Force Microscope from Bruker

Bruker’s Photoconductive Module for the Dimension Icon® Atomic Force Microscope (AFM) enables quantitative nanoscale electrical characterization of organic photovoltaics (OPVs) at the highest resolution. In addition, the module provides compatibility with both industry-standard Newport solar simulators for uniform sample illumination and Bruker’s AFM Environmental Control 1ppm Turnkey accessory.

Building upon proprietary PeakForce TUNA™ nanoelectrical characterization and the Icon’s industry-best AFM performance, this photoconductive atomic force microscopy (pcAFM) solution provides the highest resolution, most reliable photoconductivity mapping available for soft, fragile samples such as OPV materials.

The Complete Solution for pcAFM

  • Highest resolution conductivity imaging with PeakForce TUNA
  • Correlated quantitative nanomechanical property mapping with PeakForce QNM®
  • Turnkey OPV environmental control with 1ppm glovebox package
Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Other Equipment by this Supplier
Other Equipment