Kelvin
probe force microscopy (KPFM) maps electrostatic potential at
sample surfaces to provide information about electronic structure,
doping level variations, trapped charges, and chemical identity in
applications ranging from organic photovoltaics research to silicon and
wide bandgap semiconductor characterization.
Bruker’s PeakForce KPFM™ module for the Dimension Icon® and
MultiMode® 8 AFMs combines the complete set of KPFM detection
mechanisms, including amplitude and frequency modulation, with both
TappingMode™ and PeakForce Tapping™ to provide directly correlated
quantitative nanomechanical data. The result is improved sensitivity of
the frequency-modulation measurements and immunity to artifacts from
mechanical crosstalk.
In addition, PeakForce KPFM provides a completely automated
parameter setup with ScanAsyst®. The result is a significant
improvement in quantitative surface potential data for materials
research as well as semiconductor applications.
The Complete KPFM Solution
- Most accurate, repeatable, and sensitive work function
measurements
- Leading-edge spatial resolution combined with artifact-free
potential contrast
- PeakForce QNM® correlated quantitative nanomechanical property
mapping
- ScanAsyst® ease of use and optimized results