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Characteristics and Properties of Single and Multi Walled Carbon Nanotubes

Various carbon structures are of interest to nano-technologists including buckminsterfullerenes and single and multi walled carbon nanotubes.

From Cheap Tubes Inc. 16 May 2006

Recent Advances in Novel Drug Delivery Systems

Reviewed herein are the most recent developments in the area of drug delivery systems. Systems such as colloidal dug carriers, micelles, liposomes, dendrimers, liquid crystals, nanopoarticles, hydrogels, molecular imprint technology & bioconjugates, along with the various delivery methods.

25 Mar 2006

Design, Components and Operation of an Atomic Force Microscope

This article serves as a basic introduction to the design and operation of an atomic force microscope. It covers basic concepts and technologies that help understand the construction and operation of an atomic force microscope.

17 Feb 2006

Nanoscale Tribology and Lubrication Analysis Using Atomic Force Microscopy

Tribology plays a critical role in diverse technological areas. In the advanced technological industries of semiconductor and data storage, tribological studies help optimize polishing processes and lubrication of data storage substrates.

16 Feb 2006

Analysis of DVD Surface Topography Using Atomic Force Microscopy

Directly measuring the topography of bits on DVD masters and replicas with an Atomic Force Microscope (AFM) is useful for quality control and process development.

16 Feb 2006

Atomic Force Microscope Analytical Methods Compared With Other Techniques For Measuring Surface Roughness and Surface Texture

There are numerous analytical methods for establishing the surface roughness as well as the visualization of surface texture. Each of these methods has its own advantages and disadvantages. This article briefly compares and contrasts these techniques.

15 Feb 2006

Defect Inspection and Analysis Using Atomic Force Microscopy

The Atomic Force Microscope (AFM) employs a system of sensing the extremely small differences between the atomically sharp silicon probe and surface under investigation. This sensitivity is essential in monitoring and measuring the nanometer sized surface detail and any defects or flaws.

15 Feb 2006

kSA MOS Ultra-Scan Flexible, High-Resolution Scanning Curvature And Stress Measurement System From k-Space Associates

The kSA MOS Ultra-Scan is a flexible, high-resolution scanning curvature and stress measurement system. Based on proven kSA MOS technology, this fully integrated ex-situ tool maps the curvature of semiconductor wafers, optical mirrors, lenses, or practically any polished surface.

From k-Space Associates, Inc. 8 Feb 2006

Semiconductor Temperature Monitors - The kSA BandiT from k-Space Associates

The kSA BandiT is a non-contact, non-invasive, real-time, absolute wafer temperature sensor. Using the temperature-dependent optical absorption edge of semiconductor materials, the kSA BandiT provides a viable solution for wafer temperature monitoring that pyrometers cannot measure.

From k-Space Associates, Inc. 8 Feb 2006

In the Public Eye: The Early Landscape of Nanotechnology among Canadian and U.S. Publics

Based on national surveys in the U.S. and Canada, this study reports on public awareness and early perceptions of nanotechnology. Results show early optimism for nanotechnology and expectations of societal benefits. Factors influencing view points are discussed.

30 Dec 2005