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Defect Inspection and Analysis Using Atomic Force Microscopy

The Atomic Force Microscope (AFM) employs a system of sensing the extremely small differences between the atomically sharp silicon probe and surface under investigation. This sensitivity is essential in monitoring and measuring the nanometer sized surface detail and any defects or flaws.

15 Feb 2006

kSA MOS Ultra-Scan Flexible, High-Resolution Scanning Curvature And Stress Measurement System From k-Space Associates

The kSA MOS Ultra-Scan is a flexible, high-resolution scanning curvature and stress measurement system. Based on proven kSA MOS technology, this fully integrated ex-situ tool maps the curvature of semiconductor wafers, optical mirrors, lenses, or practically any polished surface.

From k-Space Associates, Inc. 8 Feb 2006

Semiconductor Temperature Monitors - The kSA BandiT from k-Space Associates

The kSA BandiT is a non-contact, non-invasive, real-time, absolute wafer temperature sensor. Using the temperature-dependent optical absorption edge of semiconductor materials, the kSA BandiT provides a viable solution for wafer temperature monitoring that pyrometers cannot measure.

From k-Space Associates, Inc. 8 Feb 2006

In the Public Eye: The Early Landscape of Nanotechnology among Canadian and U.S. Publics

Based on national surveys in the U.S. and Canada, this study reports on public awareness and early perceptions of nanotechnology. Results show early optimism for nanotechnology and expectations of societal benefits. Factors influencing view points are discussed.

30 Dec 2005

From Nautilus to Nanobo(a)ts: The Visual Construction of Nanoscience

The view that nanotechnology will lead to tiny robotic submarines navigating our bloodstream is ubiquitous but there is an almost surreal gap between what the technology is believed to promise and what it actually delivers. This paper relates popular culture, to imagination to science.

23 Dec 2005

Capacitive Displacement Sensor – Design and Characterisation of a Long Range, Low Noise Non-Contact Position Senors

The design and characterisation of a long-range capacitive displacement sensor, NanoSensor® model NXE2 is provided.

From Queensgate Instruments Ltd 9 Dec 2005

Design and Characterisation of Nanometer Precision Mechanisms

To meet the demands of ultra-precision positioning and scanning, a series of precision positioning mechanisms have been developed by Queensgate Instruments. They combine piezoelectric and NanoSensor technologies into multi-axis positioners with sub-nanometric accuracy.

From Queensgate Instruments Ltd 9 Dec 2005

Design and Characterisation of an Ultra-Precision X-Y Stage – The NPS-XY-100A

This paper describes the design of an ultra-precision xy positioning and scanning stage the Queensgate NPS-XY-100A. Special emphasis is placed on the design concept and metrological considerations. Resolution, linearity, hysteresis, thermal expansion and parasitic motions are considered.

From Queensgate Instruments Ltd 8 Dec 2005

Comparative Study by X-Ray Reflectivity of Mesoporous Silica Thin Films Templated by F127 and P123 Surfactants

Silica thin films templated by two triblock copolymers (P123 and F127) from the pluronics family and having the p6m two dimensional symmetry were investigated by X-ray Reflectivity (XR) before and after removing the surfactant from the silica matrix.

7 Dec 2005

Direct Observation of Single Catalytic Events of Chitosanase by Atomic Force Microscopy

Single catalytic events of the enzyme chitosanase have been observed by measuring height fluctuations of proteins using an atomic force microscope (AFM) operated in fluid tapping mode.

5 Dec 2005