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TEM Control and Image Acquisition Software Available as Open Source Code from FEI

FEI and The Scripps Institute have announced that the Leginon™ software system, an advanced solution for automated control and image acquisition from a transmission electron microscope (TEM), will now be available ...

3 Aug 2007

Automation of Nanotech Manufacturing May Be Ahead

In an assist in the quest for ever smaller electronic devices, Duke University engineers have adapted a decades-old computer aided design and manufacturing process to reproduce nanosize structures with features on the or...

2 Aug 2007

The Perfect Summer Combination: Beer and Physics

John Page is a leading expert on the use of multiply scattered acoustic waves to study changes in physical systems and the movement of particles through a medium — in this case, bubbles in a glass of beer. He direc...

2 Aug 2007

Callibration Services for Nanotechnology Metrology Instruments from CEMMNT

The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) has expanded its measurement, characterisation and design capabilities for industry to provide extensive calibration and test services throug...

2 Aug 2007

FEI Encourages Nano-Awareness through Video Games

As governments and corporations around the world continue to increase investments in nanoscale research and development, there is an alarming decline in the number of students who choose to pursue studies in science and ...

1 Aug 2007

Imago To Introduce New Atom Probe, The LEAP 3000X HR

Imago are expected to announce a new atom probe later this week at the Microscopy & Microanalysis meeting in Fort Lauderdale. The new atom probe is the LEAP 3000X HR. $$IMAGE$$ The "HR" acronym des...

1 Aug 2007

Nanopoint Wins International Design Excellence Award With cellTRAY™ For Cell Culturing and Nanotechnology

Nanopoint won its first design award in the international BusinessWeek/IDSA competition this month, with the innovative Nanopoint cellTRAY taking gold in the Medical and Scientific Products category. The annual intern...

From Nanopoint Inc. 26 Jul 2007

E M Optomechanical Announces Introduction of 3D MEMS Optical Profiler for Microsystems Training

E M Optomechanical, Inc., has introduced a new version of its 3D MEMS Optical Profiler that has been specifically configured to meet the needs of educational institutions. Known as the OPTOPro Model 622-EDU, the Profiler...

From Optomec 24 Jul 2007

Magnetic Tape Analysis 'Sees' Tampering in Detail

The National Institute of Standards and Technology (NIST) has developed an improved version of a real-time magnetic microscopy system that converts evidence of tampering on magnetic audio and video tapes—erasing, o...

24 Jul 2007

Euro AFM Forum at University of Münster Focuses on Current Research in Atomic Force Microscopy

Asylum Research, in conjunction with the University of Münster, CeNTech, and Atomic Force F&E, announces the Euro AFM Forum to be held at the University of Münster, Germany, Sept. 3-5. The Euro AFM Fo...

23 Jul 2007