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Researchers Develop Promising Cold Field-Emission Electron Source for Next-Generation Electron Microscopes

A NIMS research team developed technology to fabricate lanthanum hexaboride (LaB6) single-crystal nanowires, a promising cold field-emission electron source for electron microscopes and other devices, and thereby improved the performance and stability of the electron source.

25 Jan 2016

Non-Destructive Technique to Simultaneously Determine Polarities of Numerous Semiconducting Nanowires

Researchers at the University of Valencia have developed a technique to determine the individual polarities of hundreds of semiconducting nanowires in a single, time-saving process. Led by Ana Cros, director of the University’s Materials Science Institute (ICMUV), the study constitutes a major step forward in both our understanding and application of these structures, since their polarity defines the properties of devices made from them.

29 Dec 2015

Researchers Image Individual Nanoparticles at the Atomic-Level During Heating

Researchers from McMaster University in Hamilton, Ont., have taken atomic-level images of individual nanoparticles during heating that could lead to improved fuel-cell technologies at lower cost, reduce dependence on imported oil and minimize greenhouse gas emissions.

21 Dec 2015

MIT Atomic Force Microscope Scans Images 2,000 Times Faster

Massachusetts Institute of Technology (MIT) engineers have designed a new atomic force microscope (AFM) that has the capability to scan images 2,000 times faster than models currently on the market. The microscope enables nearly real-time video of nanoscale chemical processes.

14 Dec 2015

Nanostructures in Tarantula Hair Could be Key for Improved Screen Design

Researchers have determined that the bright blue colour of tarantulas are the result of multilayer nanostructures present in their hair. The researchers hope to mimic the hairs properties to create new dyes, and to improve the performance of computer and TV screens.

1 Dec 2015

EM Resolutions Introduces EM-Tec MCS Series of Standards for SEM Calibration

EM Resolutions, manufacturers and suppliers of tools and accessories for users of electron microscopes, announce new standards for SEM calibration – the EM-Tec MCS Series.

From EM Resolutions Ltd 26 Nov 2015

Optimized ZEISS OPMI PENTERO 800 Surgical Microscope Enables Better Visualization in Complex Reconstructive Surgery

The capabilities of the OPMI® PENTERO® 800 surgical microscopes from ZEISS for reconstructive surgery have been enhanced by the introduction of the INFRARED 800 module.

6 Nov 2015

Flexible Microlenses that can Capture Panoramic Images have been Developed

A team of engineers from the University of Wisconsin-Madison have developed miniature lenses with a wide range of vision inspired by the multi-faceted eyes of insects. For the first time ever, flexible, Fresnel zone plate microlenses featuring a large field of view have been developed based on this novel approach.

4 Nov 2015

Complementary Microscopy Helps Solve Structure of Lithium- and Manganese-Rich Transition Metal Oxides

Berkeley Lab scientists unravel structural ambiguities in lithium-rich transition metal oxides.

31 Oct 2015

High-Speed AFM Reveals Deformation of Cell Membranes by Protein Complex

Cell membranes are very elastic. They can become distorted when they are asked to do so, when the cell divides, or when a virus detaches itself from the cell. In both cases, the membrane is deformed by a protein complex called ESCRT-III.

31 Oct 2015