Nanoanalysis News

RSS

Bruker Introduces Dektak XTL to Address Semiconductor Needs

Bruker (NASDAQ: BRKR) today announced the release of the Dektak XTL Stylus Profiler, extending its industry-leading stylus profilometry capabilities to 200 and 300 millimeter semiconductor wafer fabs and next-generation touch panel manufacturers.

From Bruker Nano Surfaces and Metrology 4 Mar 2014

Unique Method of Light-Matter Interaction Analysis Helps Make Better Semiconductor Nanowires

A new twist on a very old physics technique could have a profound impact on one of the most buzzed-about aspects of nanoscience.

4 Mar 2014

Malvern Reports on NanoSight Nanoparticle Tracking Analysis Systems

Malvern Panalytical acquired NanoSight in September 2013 extending its portfolio of solutions for analysis at the nanoscale. Malvern Panalytical has been active in nanoparticle characterization for many years but in this broad and highly dynamic field there is no single answer to the challenge of characterizing nanoscale materials.

From Malvern Panalytical 4 Mar 2014

Advanced Wavelength Scanning Interferometer to be Installed at CPI’s National Printable Electronics Centre

As part of the FP7 NanoMend project, The Centre for Process Innovation (CPI), IBS Precision Engineering and The University of Huddersfield have been working together to design and manufacture a state-of-the-art Wavelength Scanning Interferometer system that enables the fast surface measurement of low contrast defects at pre-industrial scale.

From CPI Head Office 3 Mar 2014

Most Comprehensive Study of Block Copolymer Nanoparticle Self-Assembly Processes

For close to two decades, Cornell scientists have developed processes for using polymers to self-assemble inorganic nanoparticles into porous structures that could revolutionize electronics, energy and more.

28 Feb 2014

Toshiba Nanoanalysis Corporation has Selected ZEISS Xradia 520 Versa 3D X-ray Microscope

Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope (XRM) to expand the capabilities of its busy analysis lab.

From Carl Zeiss Microscopy GmbH 28 Feb 2014

HORIBA Scientific Announces New Confocal Raman System for Pittcon 2014 - XploRA™ PLUS

HORIBA Scientific (HORIBA), the global leader in Raman spectroscopy systems, is proud to announce the launch at Pittcon, of their new XploRA™ PLUS Raman microscope. XploRA™ PLUS incorporates unique and powerful research functions in an impressively compact analytical bench footprint.

From HORIBA 28 Feb 2014

How a 55 Year Old Lecture 'Think Small' Has Influenced a Modern Day Start-up

On December 29, 1959, when physicist Richard Feynman stood behind a podium at the annual meeting of the American Physical Society to give his talk, There's Plenty of Room at the Bottom, the IBM Series 7000 computer was the top of the line model for scientific computing.

From Nanotronics Imaging 28 Feb 2014

Researchers Perform Chemical Analysis by Roasting Nanoparticles on Top of Quartz Crystals

Researchers from the National Institute of Standards and Technology (NIST) and the Food and Drug Administration (FDA) have demonstrated that they can make sensitive chemical analyses of minute samples of nanoparticles by, essentially, roasting them on top of a quartz crystal.

From National Institute of Standards and Tech (NIST) 25 Feb 2014

PI miCos Release New Compact, High Resolution Linear Positioning Stages

High positioning resolution and smallest dimensions are the key features of this new series of linear and rotary positioning systems from PI miCos.

From PI (Physik Instrumente) LP 20 Feb 2014

Nanoanalysis News

Bruker Introduces Dektak XTL to Address Semiconductor Needs

Unique Method of Light-Matter Interaction Analysis Helps Make Better Semiconductor Nanowires

Malvern Reports on NanoSight Nanoparticle Tracking Analysis Systems

Advanced Wavelength Scanning Interferometer to be Installed at CPI’s National Printable Electronics Centre

Most Comprehensive Study of Block Copolymer Nanoparticle Self-Assembly Processes

Toshiba Nanoanalysis Corporation has Selected ZEISS Xradia 520 Versa 3D X-ray Microscope

HORIBA Scientific Announces New Confocal Raman System for Pittcon 2014 - XploRA™ PLUS

How a 55 Year Old Lecture 'Think Small' Has Influenced a Modern Day Start-up

Researchers Perform Chemical Analysis by Roasting Nanoparticles on Top of Quartz Crystals

PI miCos Release New Compact, High Resolution Linear Positioning Stages

Enhanced Antibacterial Polylactic Acid-Curcumin Nanofibers for Wound Dressings

Levidian and Zentek Seek to Establish Graphene-Integrated Filter Manufacturing Facility in the Middle East to Advance Cleaner, Safer Air

Gold Nanoparticles to Restore Vision in Retinal Disorders

Scalable Method for Porous Graphene Membranes for CO2 Capture

Self-Aligned Carbon Nanotube Phototransistors for Infrared Detection

Overcoming Nanogold Production Challenges

Electrospinning and the Future of Nanotechnology

How Electrospinning is Shaping the Future of Nanotechnology

Sponsored Content

Utilizing Back-Gate Voltage Biases for 2D Materials

Resistivity Metrology for Sputtered ITO Thin Films

How Plasma Cleaning Technology Tackles Hydrocarbon Contamination

Optimizing EV Lubricants with Electrified Tribotesting