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Anasys Will Discuss Improvements to Their AFM-IR Nanoscale Spectroscopy Products at Pittcon 2013, Booth #3050

The rapid introduction of nanostructured materials continues to drive nanoscale characterization techniques to provide timely, accurate, easy to use analysis methods. Anasys designs breakthrough, award-winning products that measure nanoscale material properties while providing high quality AFM imaging. This family of instrumentation includes the nano-TA™ which provides nanoscale thermal property measurements and the nanoIR™ platform which has pushed the barriers of the field of nanoscale IR measurement to new levels of resolution.

5 Feb 2013

Researchers Probe Cells on Nanoscale Using Gigahertz Waves

Sound waves are widely used in medical imaging, such as when doctors take an ultrasound of a developing fetus. Now scientists have developed a way to use sound to probe tissue on a much tinier scale.

2 Feb 2013

New Insights into Control of Plasma Behavior with Ultra-Thin Lithium Films on Graphite

The research of a multi-institutional team from the U.S., Japan, and France, led by Predrag S. Krstic of the Joint Institute for Computational Sciences and Jean Paul Allain of Purdue University has answered the question of how the behavior of plasma—the extremely hot gases of nuclear fusion—can be controlled with ultra-thin lithium films on graphite walls lining thermonuclear magnetic fusion devices.

1 Feb 2013

NanoScope Services Extends FIB Web Conferencing Capability To Include High Resolution Optical Microscopy

NanoScope Services Ltd. An innovative European provider of outsourced microscopy and ion beam ‘nano-surgery’ services, announced today the extension of its novel LiveFIBTM web based consultancy capability – to include high resolution optical microscopy.

From NanoScope Services Ltd. 31 Jan 2013

Agar Scientific Announces Kleindiek Positioning Tools Now Available For Benchtop SEM Systems

Agar Scientific, a leading supplier of microscopy accessories and consumables, announces that Kleindiek Nanotechnik's micro-manipulation, nano-positioning and probing tools are now available for use in most benchtop scanning electron microscopes.

From Kleindiek Nanotechnik 30 Jan 2013

Researchers at Lomonosov Moscow State University Use Nanoparticle Tracking Analysis for Vaccine Characterization

NanoSight reports on how Nanoparticle Tracking Analysis, NTA, is used for vaccine characterization and standardization in the virology research group of Dr Nikolai Nikitin at Lomonosov Moscow State University.

29 Jan 2013

Advanced Molecule-Specific Imaging Method Provides New Insights into Cell Membrane Organization

Sight would dramatically alter a blind man's understanding of an elephant, according to the old story. Now, a look directly at a cell surface is changing our understanding of cell membrane organization.

From University of Illinois at Urbana-Champaign 29 Jan 2013

Nanotech Researchers Harness Barkhausen Effect to Study Insides of Magnetic Materials

(Edmonton) Almost 100 years after the initial discovery, a team of scientists at the University of Alberta and the National Institute for Nanotechnology in Edmonton have harnessed the Barkhausen Effect as a new kind of high-resolution microscopy for the insides of magnetic materials.

18 Jan 2013

New INRS Infrastructure Combines DTEM with Advanced Nanosecond Laser Technologies

Professor Federico Rosei, Director of the INRS Energy Materials Telecommunications Research Centre, will soon have access to a Dynamic Transmission Electron Microscope (DTEM). Unique in the world for its configuration, this equipment will fill a gap in dynamic materials imaging by simultaneously providing very high spatial and temporal resolution, a first that could revolutionize materials research.

17 Jan 2013

Oxford Instruments Launches LayerProbe Layer Thickness Measurement Option for FIBs and SEMs

Oxford Instruments NanoAnalysis, a world leader in microanalysis software and systems, has announced the launch of LayerProbeTM, an exciting new software tool for the characterisation of thin layers on a substrate. An option for the Oxford Instruments’ AZtec® EDS microanalysis system, LayerProbe is faster, more cost-effective and higher resolution than dedicated film measurement tools.

From Oxford Instruments NanoAnalysis 11 Jan 2013

Nanoanalysis News

Anasys Will Discuss Improvements to Their AFM-IR Nanoscale Spectroscopy Products at Pittcon 2013, Booth #3050

Researchers Probe Cells on Nanoscale Using Gigahertz Waves

New Insights into Control of Plasma Behavior with Ultra-Thin Lithium Films on Graphite

NanoScope Services Extends FIB Web Conferencing Capability To Include High Resolution Optical Microscopy

Agar Scientific Announces Kleindiek Positioning Tools Now Available For Benchtop SEM Systems

Researchers at Lomonosov Moscow State University Use Nanoparticle Tracking Analysis for Vaccine Characterization

Advanced Molecule-Specific Imaging Method Provides New Insights into Cell Membrane Organization

Nanotech Researchers Harness Barkhausen Effect to Study Insides of Magnetic Materials

New INRS Infrastructure Combines DTEM with Advanced Nanosecond Laser Technologies

Oxford Instruments Launches LayerProbe Layer Thickness Measurement Option for FIBs and SEMs

New Study Finds Electrons Flow Like Liquid in Graphene, Breaking Rules

Research Boosts Graphene’s Potential to Unprecedented Heights

Novel 3D Imaging Technique Captures In Situ Nanoparticle Self-Assembly

Nanoparticles That Boost Tomato Plant Growth

Orange Peel Nanoparticles: New Green Synthesis

Enhancing Slurry Stability in Lithium-Ion Batteries with Turbiscan Technology

PiFM and its Role in Nanoscale Chemical Imaging

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

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How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors

Overcoming the Limits of Traditional DLS in Lipid-Based Nanoparticle Manufacturing

PiFM for Nanoscale Chemical Mapping of Polymers

Next-Generation Biological Imaging Using Raman-SEM