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Registrations Now Open for Symposium on Applications of SPM's and Optical Tweezers

JPK Instruments is happy to announce that registration is now open for the ninth annual international symposium on the applications of scanning probe microscopy (SPM) and optical tweezers. The symposia will be held on the 6-7th October 2010 in Berlin focusing on applications developments in life sciences.

From Bruker BioAFM 20 Jul 2010

Anasys nanoIR Wins Prestigious R+D 100 Award

Anasys Instruments is pleased to announce that their nanoIR™ platform, a powerful new measurement tool that reveals the chemical composition of samples at the nanoscale, has been selected to receive a prestigious R+D 100 Award.

15 Jul 2010

Scanning Tunneling Microscope Helps to Understand Non-Superconducting Electronic Phase

Scientists have been trying for some 20 years to understand why the low temperature at which copper-oxide superconductors carry current with no resistance can't be increased to be closer to room temperature.

15 Jul 2010

Using Optical Microscopy to Image Objects with Resolutions as Small as 0.5 Nanometers

Secretary of Energy, Nobel laureate and former director of the Lawrence Berkeley National Laboratory (Berkeley Lab) Steven Chu led the development of a technique that enables the use of optical microscopy to image objects or the distance between them with resolutions as small as 0.5 nanometers.

From Lawrence Berkeley National Laboratory 14 Jul 2010

Enhanced Resolution in Low kv Region with New Electron Source Technology

Today, Carl Zeiss introduces EVO® HD, its latest innovation in the conventional Scanning Electron Microscopy (C-SEM) market segment. Delivering much higher resolution at low acceleration voltages compared to present conventional SEM, the EVO® HD introduces High Definition to electron microscopy.

From Carl Zeiss Microscopy GmbH 14 Jul 2010

Micromeritics ElectroPrep Produces Constant Supply of Filtered Electrolyte

For instruments using the electrical sensing zone sizing/counting technique (Coulter Principle), it is imperative that the dispersion electrolyte be free of particles. Even electrolyte from a newly opened vessel often contains particle concentrations too high for critical analyses.

From Micromeritics International Sales 12 Jul 2010