Nanooptics and Nanophotonics News

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STMicroelectronics, bTendo to Develop World's Smallest MEMS-Based Pico Projector

STMicroelectronics one of the world's largest semiconductor manufacturers and the world's leading supplier of MEMS sensors for consumer and portable applications, and bTendo Ltd. announced today that they have signed a development and license agreement to jointly develop the world's smallest Pico Projector for smart phones and other portable consumer-electronics devices.

From STMicroelectronics 14 Feb 2011

NU Purchases Caliper's IVIS Imaging System for Nano-Particle Technology Research

Caliper Life Sciences, Inc. a leading provider of tools and services for drug discovery, life sciences research and molecular diagnostics, today announced it has installed the 1000th IVIS preclinical imaging system, a milestone event in the continued rapid adoption of Caliper's proprietary in vivo imaging solutions.

11 Feb 2011

Agilent Expands Spectroscopy Business by Acquiring Specific Assets of A2 Technologies

Agilent Technologies Inc. has completed the acquisition of specific assets of A2 Technologies. Financial details were not disclosed for the acquisition, which was first announced Jan. 19.

From Agilent Technologies Inc. 11 Feb 2011

New Frontier Infrared Spectrometer from PerkinElmer

PerkinElmer Inc., a global leader focused on the health and safety of people and the environment, today announced the launch of the Frontier(TM) Infrared Spectrometer, a high performance infrared (FT-IR) spectrometer built using PerkinElmer’s industry-leading spectroscopy expertise.

11 Feb 2011

Improved Spectroscopy Method for Ultra-Fast Analysis of Aluminum Inclusions

Thermo Fisher Scientific, Inc., the world leader in serving science, today announced the launch of an improved method for ultra-fast analysis of inclusions in aluminum using optical emission spectroscopy (OES).

10 Feb 2011

Bristol Scientists' New Tool Helps to Understand Nanostructure of Exotic Alloys

The wonder of science often comes from the endless possibilities opened up by each successive discovery and the unexpected findings that result. Scientists at the University of Bristol now have a new tool that will yield yet more and unprecedented levels of information – and crucially, without disturbing the natural, physical state of the object under scrutiny.

9 Feb 2011

Rudolph Receives Multiple Orders for Latest Opaque Thin Film Metrology Tool

Rudolph Technologies, Inc. a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, announced today that it has received multiple system orders from a major Asian foundry and an IDM (integrated device manufacturer) with fabrication facilities in the U.S. for its latest MetaPULSE®-G opaque metrology tool.

From Onto Innovation 8 Feb 2011

Veeco Introduce New GaN MOCVD Multi-Reactor System for Producing HB-LEDs

Veeco Instruments Inc. (Nasdaq: VECO) announced today the introduction of the TurboDisc(R) MaxBright(TM) Gallium Nitride (GaN) Metal Organic Chemical Vapor Deposition (MOCVD) Multi-Reactor System for production of high-b...

From Veeco 7 Feb 2011

UC Berkeley Researchers Identify New Way for Growing Nanolasers on Silicon

Engineers at the University of California, Berkeley, have found a way to grow nanolasers directly onto a silicon surface, an achievement that could lead to a new class of faster, more efficient microprocessors, as well as to powerful biochemical sensors that use optoelectronic chips.

7 Feb 2011