Nanobusiness News

RSS

Renishaw's PH10 Motorised Indexing Heads for CMMs Now Have a 20% Improvement in Repeatability

Following a series of design enhancements, Renishaw’s industry-standard family of PH10 motorised indexing heads for co-ordinate measuring machines (CMMs) now have a 20% improvement in repeatability and increased long-term stability.

From Renishaw plc - Spectroscopy 28 Jul 2009

Flexible Pin Configuration Supports Diverse DRAMs and Improves Throughput

Advantest Corporation today announced availability of its new T5385 memory test system for dynamic random access memory (DRAM) wafer test, offering a parallel test capability of 768 devices -- the highest in the industry...

28 Jul 2009

Vacuum Laminated Dry Films for 3D TSVs Flow Into Vias for Void Free, Planarized Coverage

Shin-Etsu MicroSi has introduced an extension of their photosensitive dry film dielectric technology for 3D Through-Silicon Vias and two-dimensional wafer bonding applications. This SINR negative photoresist film, introduced last year, is available now in thicknesses from 12 to 100 microns.

28 Jul 2009

Customized Microscope Systems to Meet Even the Highest Demands

With Axio Imager 2, Carl Zeiss is presenting the new generation of its proven microscope system for biomedical research and materials applications. The customized configurability of the ten stand versions meets user requirements for a solution that combines outstanding flexibility and maximum ease of use with the highest performance and functionality.

From Carl Zeiss Microscopy GmbH 28 Jul 2009

Nextreme Enters into a Cooperation Agreement with Lockheed Martin

Nextreme Thermal Solutions, the leader in microscale thermal and power management products for the electronics industry, and Lockheed Martin (NYSE: LMT), have entered into a cooperation agreement to develop new products based on Nextreme's thin-film thermoelectric materials.

28 Jul 2009

Executives from Ohio's Most Promising Nanotechnology Companies to Present at Upcoming Conference

The event is being hosted by the Nano-Network of New Mexico, in partnership with the Micro and Nanotechnology Commercialization Education Foundation (MANCEF), the Bi National Sustainability Laboratory, and the Ibero Amer...

28 Jul 2009

Silver Markets for Photovoltaics

Research and Markets, the leading source for international market research and market data, has announced the addition of the "Silver Markets for Photovoltaics" report to their offering. At present, the vas...

From Research and Markets 28 Jul 2009

Oxford Instruments Plasma Technology Receives Order from Bridgelux

Oxford Instruments Plasma Technology (OIPT), leader in etch, deposition and growth processes and systems, today announced an order from Bridgelux, Inc., for a System800 Plus Batch PECVD and a System133 ICP 380 Batch Etch tool.

From Oxford Instruments Plasma Technology 28 Jul 2009

Rudolph Technologies Receives Order for MetaPULSE-III Thin Film Metrology Tool from Major Memory Fab in Asia

Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, announced today that it has recently received an order for its MetaPULSE&r...

From Onto Innovation 28 Jul 2009

Freescale Semiconductor Successfully Taped Out 45-Nanometer Networking Design

Cadence Design Systems, Inc. (NASDAQ: CDNS), the leader in global electronic design innovation, today announced that Freescale Semiconductor has successfully taped out a 45-nanometer networking design using the Cadence &...

From Cadence Design Systems 28 Jul 2009

Nanobusiness News

Renishaw's PH10 Motorised Indexing Heads for CMMs Now Have a 20% Improvement in Repeatability

Flexible Pin Configuration Supports Diverse DRAMs and Improves Throughput

Vacuum Laminated Dry Films for 3D TSVs Flow Into Vias for Void Free, Planarized Coverage

Customized Microscope Systems to Meet Even the Highest Demands

Nextreme Enters into a Cooperation Agreement with Lockheed Martin

Executives from Ohio's Most Promising Nanotechnology Companies to Present at Upcoming Conference

Silver Markets for Photovoltaics

Oxford Instruments Plasma Technology Receives Order from Bridgelux

Rudolph Technologies Receives Order for MetaPULSE-III Thin Film Metrology Tool from Major Memory Fab in Asia

Freescale Semiconductor Successfully Taped Out 45-Nanometer Networking Design

Novel Semiconductor Born from Graphene and Glass

3D SiOx-Embedded Porous Carbon Nanofiber Hosts for Dendrite-Free Lithium Batteries

Biodegradable Polymers for Targeted Body Heating

Novel Liquid Crystal Process Unlocks High-Purity Carbon Nanotubes for Motor Applications

Rapid Biomimetic Nanovaccine for Personalized Cancer Therapy

PiFM and its Role in Nanoscale Chemical Imaging

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Breaking Barriers in Thin-Film Deposition with ATLANT 3D’s DALP Technology

Sponsored Content

Atomic Force Microscopy Analysis of Polymer Stiffness Under Thermal Stress

Different DLS-Based Systems Can Give Us Different Size Results, and All of Them Can Be correct!

Next Generation Magnetic Force Microscopy with PeakForce Probes

Unlocking Material Behavior at the Microscale Using Nanoindentation