Atomic Force Microscopes News

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Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Electrical impulses play an important role in cells of the human body. For example, neurons use these impulses to transmit information along their branches and the body also uses them to control the contraction of muscles.

18 Feb 2015

Highest Values of Piezoresistivity in Electroceramic Material Measured Using Atomic Force Microscopy

ICN2 Oxide Nanoelectronics Group obtains conductivity values for stroncium iridate 250 times higher than in normal conditions, just pressing with nanometric needles. The results, published in Nanoscale, where obtained thanks to the use of the atomic force microscope (AFM) showing that the material could become a good candidate for future applications in sensors and electronics.

18 Feb 2015

Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Researchers at the Department of Energy’s (DOE) Oak Ridge National Laboratory (ORNL) have discovered a new method to control friction in ionic solids at the nanoscale using ambient water vapor and electrical stimulation. Friction affects motion and hence frictional forces have to be controlled. Traditionally, lubrication or mechanistic means have been used for controlling friction forces.

From Oak Ridge National Laboratory 29 Jan 2015

Oxford Instruments Asylum Research Announces AFM Image Contest Winners

Oxford Instruments Asylum Research is pleased to announce the winners of its AFM Image Contest.

From Asylum Research - An Oxford Instruments Company 12 Jan 2015

Atomic Force Microscopy Etches Nanoscale Patterns on Conductive Polymers

Researchers at Oak Ridge National Laboratory (ORNL) have successfully carved out nanoscale designs on polymer surfaces using atomic force microscopy (AFM).

From Oak Ridge National Laboratory 18 Dec 2014

NIST Sensor May Help Sidestep Problems in Calibrating AFMs

Spotting molecule-sized features—common in computer circuits and nanoscale devices—may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).

18 Dec 2014

Bruker Releases BioScope Resolve™ Biological Atomic Force Microscope at Sixth AFM BioMed Conference

At the Sixth AFM BioMed Conference, Bruker today announced the release of BioScope Resolve™, a biological atomic force microscope (bioAFM) that features the highest resolution imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope (IOM).

From Bruker 17 Dec 2014

Oxford Instruments Launches Innovative Product for SEM-Based Particle Analysis

Oxford Instruments, the leading supplier of SEM-based particle analysis systems, has introduced its next generation particle analysis platform, AZtecFeature.

From Oxford Instruments NanoAnalysis 8 Dec 2014

Global Atomic Spectroscopy Market Forecast to Grow at 7.01% CAGR

Atomic spectroscopy is a technique used to analyze the elemental composition of an analyte by its electromagnetic or mass spectrum. This analysis is conducted with the help of spectral instruments by measuring the radiation intensity as a function of wavelength. The spectral instruments used in atomic spectroscopy are referred to as spectrometers or spectral analyzers.

3 Dec 2014

JPK Study Plant Cells at the University of Queensland using AFM

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of AFM and the CellHesion® module to study plant cell wall biology in the School of Chemical Engineering at the University of Queensland.

From Bruker BioAFM 25 Nov 2014