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Bruker's New Nanomechanics Package Provides AFM Tools for Life Science Research

Bruker introduces the new Nanomechanics Package for its line of BioAFMs, including the BioScope Catalyst. The new accessory enables the fastest, highest resolution, and most quantitative characterization of nanomechanical properties over a wide range of biological samples.

From Bruker Nano Surfaces and Metrology 20 Sep 2012

Study Findings Provide New Insights to Explore Future Graphene Devices

Using noncontact atomic force microscopy (AFM), IBM researchers have for the first time differentiated the individual molecules’ chemical bonds, thus extending the boundaries of analysis involving atoms and molecules at the smallest scale possible.

17 Sep 2012

Researcher Produces High Resolution Images of DNA Double Helix in Aqueous Environment Using JPK Vortis AFM Controller

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of AFM systems in the group of Dr Bart Hoogenboom of the London Centre for Nanotechnology.

From Bruker BioAFM 29 Aug 2012

Bruker Introduce Photoconductive Atomic Force Microscopy Module

Bruker today announced the release of the Photoconductive Atomic Force Microscopy (pcAFM) module for its industry leading Dimension Icon® platform.

From Bruker Nano Surfaces and Metrology 14 Aug 2012

Bruker Launch PeakForce Kelvin Probe Force Microscopy for AFMs

Bruker announced today the release of the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). PeakForce KPFM™ utilizes frequency-modulation detection to provide the highest spatial resolution Kelvin probe data.

From Bruker Nano Surfaces and Metrology 13 Aug 2012

AFM and Nanoscale IR Spectroscopy Used to Reverse Engineer Polymers

A recent publication in Spectroscopy Europe by lead authors from Kimberly Clark Corporation showed the use of AFM based nanoscale IR Spectroscopy for reverse engineering of polymeric multilayer films.

24 Jul 2012

University of Calgary Use NanoWizard AFM to Advance Medical Research

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their NanoWizard AFM systems at the Microscopy & Imaging Facility (MI...

From Bruker BioAFM 24 Jul 2012

Bruker Launches Three New Products for Semiconductor Metrology at Semicon West 2012

Today at SEMICON West 2012, Bruker announced three new 450mm X-Ray and AFM semiconductor metrology products to support the industry’s transition to larger wafer production. These new products include the InSight-450 3DAFM from Bruker’s Nano Surfaces division and both the next generation of the D8 FABLINE and the new S8 FABLINE-T X-ray systems from Bruker’s AXS division.

From Bruker Nano Surfaces and Metrology 11 Jul 2012

Bruker Launch Turnkey EC-AFM Solution for Lithium Battery Research

Bruker today announced the release of the first turnkey solution for Li battery electrochemical atomic force microscopy (EC-AFM) research. The new EC-AFM accessory adds a sealed electrochemical cell specifically designed for battery research and turn-key 1ppm environmental control to the industry-leading Dimension Icon® AFM platform to enable long-term in situ studies of Li battery electrodes.

From Bruker Nano Surfaces and Metrology 20 Jun 2012

JPK Instruments Reports on Use of AFM in Life Science Research at the University of Wollongong

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of AFM to study the nanoscale interactions of biological systems at the Intelligent Polymer Research Institute (IPRI) and ARC Centre of Excellence for Electromaterials Science (ACES) of the University of Wollongong in the group of Dr Michael Higgins.

From Bruker BioAFM 12 Jun 2012