Chemists at the University of Illinois have created a simple and inexpensive molecular technique that replaces an expensive atomic force microscope for studying what happens to small molecules when they are stretched or ...
Forget dancing angels, a research team from the National Institute of Standards and Technology (NIST) and the University of Colorado (CU) has shown how to detect and monitor the tiny amount of light reflected directly off the needle point of an atomic force microscope probe.
Applying 60 volts grants you 0.01 mm of motion with a 5x5x10 mm multilayer
piezoelectric actuator from Noliac.
A multilayer piezoceramic actuator is thus perfect for many applications, e.g.
in atomic force microscopy.
Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology Class to be held June 3 to June 5, 2009 in Santa Barbara, California.
Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, announced today the release of its BioScope™ Catalyst™ Life Science Atomic Force Microscope (AFM). The Catalyst provides an unprecedented level of integration between atomic force microscopy and light microscopy.
The international team of scientists that made the material, including Masaki Takata of RIKEN's Harima Institute, used x-rays to reveal that it contains ordered channels of two different sizes*. The smaller channels, crowded by napthalene units, are just 0.3 nanometers (billionths of a meter) across, while the larger channels are 0.77 nanometers across.
NanoWorld - a leading manufacturer of probes for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) - announced the publication of its product brochure in nine languages. NanoWorld's product brochure i...
Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs) to the nanoscience community, announced today the release of its Dimension® Icon(TM) AFM. Building upon the world's most utilized large-sample AFM platform, the latest member of Veeco's Dimension product line delivers the highest resolution, best ease-of-use, and fastest time-to-results of any large-sample AFM on the market today.
An international team of scientists, among them researchers from the department of Theoretical Condensed Matter Physics of the Universidad Autónoma de Madrid (UAM), present a new method to manipulate atoms.
Nanot...
With its electromagnetically actuated, flexure-based XY-scanner technology combined with a piezo-based Z-scanner, the FlexAFM offers highly linear, ultra-flat, and fast scanning performance, while at the same time providing Lateral Force and liquid measuring capabilities to its users.
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